Microstructure Characterization of Semiconductors

This online course provides an in-depth exploration of techniques used to characterize the microstructure of semiconductors. Students will learn the fundamental principles of microstructural analysis, including electron microscopy, X-ray diffraction, and spectroscopic techniques, with a focus on their applications in semiconductor materials. The course emphasizes the relationship between processing, microstructure, and electronic properties, preparing students for research and industry applications in microelectronics and semiconductor engineering.

MSE59700

Credit Hours:

1

Course Description:

This online course provides an in-depth exploration of techniques used to characterize the microstructure of semiconductors. Students will learn the fundamental principles of microstructural analysis, including electron microscopy, X-ray diffraction, and spectroscopic techniques, with a focus on their applications in semiconductor materials. The course emphasizes the relationship between processing, microstructure, and electronic properties, preparing students for research and industry applications in microelectronics and semiconductor engineering.

Learning Outcomes:

By the end of the course, you will be able to:
1. CLO1: Explain the principles of microstructural characterization techniques used in semiconductor analysis.
2. CLO2: Interpret data from microscopy, diffraction, and spectroscopy methods to evaluate semiconductor materials.
3. CLO3: Predict the influence of processing conditions on microstructure and electronic performance.

Textbook and Other Resources:

All supporting materials will be provided through the Brightspace system. These resources will be organized by module and include links to journal articles, websites, etc. There is no textbook required for this course.