MSE59700 - Microstructure Characterization of Semiconductors
This online course provides an in-depth exploration of techniques used to characterize the microstructure of semiconductors. Students will learn the fundamental principles of microstructural analysis, including electron microscopy, X-ray diffraction, and spectroscopic techniques, with a focus on their applications in semiconductor materials. The course emphasizes the relationship between processing, microstructure, and electronic properties, preparing students for research and industry applications in microelectronics and semiconductor engineering.
Credit Hours: 1
Instructor: Mohamad Zbib - Associate Professor of Practice -- School of Materials Engineering
Email: mzbib@purdue.edu
Syllabus: MSE 597 Microstructer Characterization of Semiconductors
Learning Objectives:
This online course provides an in-depth exploration of techniques used to characterize the microstructure of semiconductors. Students will learn the fundamental principles of microstructural analysis, including electron microscopy, X-ray diffraction, and spectroscopic techniques, with a focus on their applications in semiconductor materials. The course emphasizes the relationship between processing, microstructure, and electronic properties, preparing students for research and industry applications in microelectronics and semiconductor engineering.
Topics Covered:
Module 1: Foundations of Semiconductor Microstructure
Module 2: Microscopy Techniques
Module 3: Diffraction and Spectroscopy Methods
Module 4: Processing Conditions and Microstructural Evolution
Module 5: Integration and Applications
Homework:
Four assignments and two discussion boards
Exams:
Three quizzes