Post Doc Research Associate
Date Posted: Wed, 05 03 2025 00:00:00 GMT
Reference Number: 1258663400A1
Internal ID: 35922-en_US
Company: Purdue University
Location: West Lafayette, IN, US
Requisition Type: Research and Laboratory
Business Unit: 4014
Job Summary
The continued march of Moore’s Law, explosion of artificial intelligence, and the prevalence of ubiquitous connectivity demands ever more capable electronic devices and circuits. Additional capability is increasingly found with “new” materials having differentiating properties. Logic roadmaps, for example, now include two-dimensional transition metal dichalcogenides. Power devices are being pursued with materials like gallium oxide and aluminum nitride having ever expanding bandgaps. Memory, meanwhile, uses too much energy for AI workflows motivating use of new materials like ferroelectric hafnia (FE-HfO2).
With new materials, comes new problems, however. Science based solutions must be developed to make the transition from “lab to fab.” This, in turn, requires developing the defect science and characterization methods that will guide the processing and development of these next-generation devices for the decade(s) to come. Recognizing this need, your position will be focused on developing these techniques. Specifically, you will develop electro-optical methods capable of imaging defects, strain, phase, and temperature in oxides used as both next generation memory elements and dielectrics in logic. By combining electrical and optical stimulus with near-field probes, your job will center on creating techniques capable of “seeing” in both real and energy space at the spatial scale of the devices themselves (<50 nm). This will be accomplished by employing Purdue’s newly acquired multi-modal near-field optical scanning system located in the Birck Nanotechnology Center. In creating the methods that will assess next generation semiconductors, the position will culminate in career opportunities spanning from academic to entrepreneurial.
Experience
• A Ph.D. in engineering, physics, or related discipline • Experience in one, or more, of the following areas: (1) multi-modal scanning probe characterization (SNOM, nanoFTIR, PFM, KPFM, etc.) (2) defect science, (3) optical spectroscopy, (4) advanced electrical characterization (DLTS, DLOS, IPE, scanning photocapacitive, etc.). • The ability to communicate expertly within and between disciplines both via the written and spoken word as evidenced via a strong scholarly record. • A demonstrated ability to work independently within an interdisciplinary team while being both mentored and taking on a mentoring role.
Job Family
Research