ECE 55900 - MOS VLSI Design

Lecture Hours: 3 Credits: 3

Counts as:
CMPE Special Content Elective
EE Elective

Normally Offered: Each Fall

Requisites:
ECE 305 and 43700

Catalog Description:
An introduction to most aspects of large-scale MOS integrated circuit design including: device fabrication and modeling; inverter characteristics; designing CMOS combinational and sequential circuits; designing arithmetic building blocks and memory structures; interconnect and timing issues; testing and verification; and system design considerations. Term projects involve the complete design of a functional logic block or system using CAD tools.

Required Text(s):
  1. Digital Integrated Circuits: A Design Perspective, 2nd Edition, J.M. Rabaey, A. Chandrakasan, B. Nikolic, Prentice Hall, 2003, ISBN No. 0-13-090996-3.
Recommended Text(s):
  1. Circuits, Interconnects, and Packaging for VLSI, H. Bakoglu, Addison Wesley, ISBN No. 0-201-06088-6.
  2. Principles of CMOS VLSI Design: A Systems Perspective, 2nd Edition, N.H.E. Weste and K. Eshraghian, Prentice Hall, 1993, ISBN No. 0-201-53376-6.

Learning Outcomes:

A student who successfully fulfills the course requirements will have demonstrated:
  1. an ability to analyze MOS circuits. [None]
  2. an ability to synthesize MOS circuits. [1,2]
  3. experience in oral presentation, teamwork, and document preparation for a finished design. [None]
  4. an ability to create and simulate a hierarchical digital design using commercial grade CAD software. [1,2,6]

Lecture Outline:

Lectures Major Topics
3 Introduction: Historical Perspective and Future Trends; CMOS Process
3 MOS devices, SPICE models
6 Inverters
9 Designing combinational logic gates in CMOS
6 Designing sequential circuits
2 Interconnect and timing issues
3 Designing memory and array structures
3 Designing arithmetic building blocks
2 VLSI testing and verification
2 System design issues
2 Mid-term tests
3 Project Presentations

Engineering Design Content:

Establishment of Objectives and Criteria
Synthesis
Analysis
Construction
Testing
Evaluation