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MSE 510 Microstructural Characterization Techniques

Sem. 2. Class 3, cr. 3.  Prerequisite:  senior or graduate standing in engineering or science.

MSE 510 is an elective course.

Weekly Schedule:  Three 50-minute lectures.

A broad variety of analytical tools will be presented. The intent is to allow the student to make an educated selection of characterization techniques, or critical analysis of published data, for materials and defect analysis. The techniques will be assessed in terms of the probe type and material response, of what device and specimen requirements are typical, and of what data can or cannot be derived from each type of analysis.

Relation of Course to Program Outcomes
1. an ability to apply knowledge of mathematics, science, and engineering to problems in materials engineering.
5. an ability to identify, formulate, and solve engineering problems, particularly in the context of materials selection and design.
7. an ability to exhibit effective oral and written communication skills.

Goals
Students should be aware of the existence, utility, and limitations of major experimental techniques utilized in assessing the microstructure of solids by imaging, by diffraction, and by spectroscopy.  Students should be capable of simple data manipulation for each technique.

Course Objectives
A successful student should be able to:
  • List a minimum of four methods: for obtaining images, for obtaining diffraction information, and for obtaining local chemical information in engineering solids.
  • List the relative advantages and disadvantages for all of the above, including items such as spatial limitations, vacuum requirements, ease of use and specimen preparation, cost, and common availability.
  • Calculate and compare wavelength- vs. aberration-limited resolution.
  • Calculate diffraction output parameters.
  • Explain the fundamental components and function of an electron or ion optical system.
  • Compare and contrast the probes, probe/specimen interaction, and signal measurement in: EDS, AES, XRF, XPS, EELS, and x-ray absorption.
  • Identify and justify the selection of at least three techniques to assess a particular given microstructure (including identification of the most important microstructural features for that particular material).
  • Independently research and communicate a written explanation of a microstructural analysis technique.

References
“Encyclopedia of Materials Characterization”, Wilson, Brundle & Evans, (Butterworth-Heineman 1992).
“Scanning Electron Microscopy & X-Ray Analysis”, 2nd ed., Goldstein, et al. (Plenum Press 1992).
“Elements of X-Ray Diffraction”, 2nd ed., Cullity (Addison-Wesley 1978).

Instructor
Eric Kvam

Contribution of course to meeting the professional component:MSE 510 is a materials-specific technical elective course.

Prepared by: Elliott Slamovich                                                            Date: April 25th, 2007