MSE 33500 Materials Characterization Laboratory
Credits and Contact Hours: 3 credits. Weekly Schedule for 15 weeks: two 50 minute lectures, one 3 hour laboratory session.
Instructors or Course Coordinators: L. Stanciu, E. Kvam.
Textbook: "Electron Microscopy & Analysis", 3rd ed., D. Goodhew, F. Humphreys, and R. Beanland (Taylor & Francis, 2001).
Specific Course Information
a. Catalog Description: The principles of analytical methods for characterization of materials for structure and composition; optical microscopy, scanning electron microscopy, x-ray spectroscopy and diffraction, atomic absorption, emission spectroscopy, and mass spectrometry. Laboratory experiments in x-ray spectroscopy, Fourier-transmission infrared spectroscopy, x-ray diffraction, optical microscopy, and scanning electron microscopy.
b. Prerequisites: MSE 23500
c. Course Status: MSE 33500 is a required course.
Specific Goals for the Course
1. All Students
A. Ability to use a variety of tools to characterize materials. Examples:
- Observation and recording of microstructures using an optical microscope.
- Collecting SEM images and EDS spectra.
- Identification of a polymer sample via FTIR
B. Exhibit knowledge of experimental methods to collect and analyze data. Examples:
- Ability to apply lineal, areal, and point count stereological techniques.
- Measurement of volume fraction of a phase, grain size, grain boundary area and density of particles.
- Ability to determine crystal structure and lattice parameter using x-ray diffraction.
- Ability to identify and quantify peaks in a powder diffraction pattern.
- Ability to identify chemical bonds from a FTIR spectrum
- Fracture mode determination from fracture surface and identification of fracture origin.
C. Understand the basis of measurement methods. Examples:
- Knowledge of the sources of signals used for secondary and back scattered electron imaging.
- Knowledge of the generation of signals used for x-ray microanalysis.
- Weibull analysis of strength data.
D. Exhibit effective communication skills. Examples:
- basic skills in technical writing of a laboratory report.
- effective oral presentation of results.
E. Demonstrate awareness of basic laboratory safety practice.
F. Develop and implement a system or algorithm to determine the identity of an unknown sample.
2. Most Students
A. An advanced understanding of the basis of measurement methods. Examples:
- show an understanding of image formation, magnification, resolution, depth of field in optical microscopy.
- discuss the reasons for ZAF corrections in x-ray microanalysis.
- understanding of computer aided data analysis in image analysis.
- Contrast mechanisms in AFM for both contact and non-contact mode.
B. Ability to apply characterization techniques for materials analysis. Examples:
- calculate spatial resolution limits for at least two different limiting conditions for x-ray microanalysis.
- calculate structure factor for simple structures and identify major factors that affect peak positions and intensities.
- Estimate of flaw distribution from fracture data.
C. Assess the validity of experimental data. Examples:
- Statistical variations in data.
- Accuracy of data relative to expected values, confidence intervals.
Relation of Course to Student Outcomes:
(MSE-3, ABET-3) an ability to communicate effectively with a range of audiences.
(MSE-6, ABET-6) an ability to develop and conduct appropriate experimentation, analyze and interpret data, and use engineering judgment to draw conclusions.
Topics Covered: scanning electron microscopy, optical microscopy, x-ray diffraction, powder analysis, infrared spectroscopy, stereology, toughness/hardness, identification of unknowns.