October 16, 2018

Prof. Alam receives 2018 IEEE Electron Devices Society Education Award

Prof. Ashraf Alam is the recipient of the 2018 IEEE Electron Devices Society Education Award. This is the highest honor from the Institute of Electrical and Electronics Engineers for distinguished contributions to education within the field of interest of the IEEE Electron Devices Society.
Prof. Ashraf Alam
Prof. Ashraf Alam, the Jai N. Gupta Professor of Electrical and Computer Engineering

Prof. Ashraf Alam is the recipient of the 2018 IEEE Electron Devices Society Education Award. This is the highest honor from the Institute of Electrical and Electronics Engineers for distinguished contributions to education within the field of interest of the IEEE Electron Devices Society. Factors for consideration include achievements and recognition in educating and mentoring students in academia or professionals in the industrial or governmental sectors.

Alam is being recognized “for educating, inspiring and mentoring students and electron device professionals around the world.” He says he is honored and deeply grateful to be chosen for this award.

"At Purdue, I am surrounded by stellar teachers, and the NCN web-platform allowed me to reach hundreds of thousands students worldwide,” he says. “Research and teaching are two sides of a coin: Teaching forces us to understand the topics deeply so that  we can explain their essence simply. The simple explanations connect the concepts in unexpected ways, suggesting new ideas for creative research."

The award will be presented at the 2018 International Electron Devices Meeting (IEDM) on December 3rd in San Francisco, CA.

Alam holds the Jai N. Gupta professorship at Purdue, where his research focuses on the physics and technology of semiconductor devices. He is a fellow of IEEE, American Physical Society (APS), and American Association for the Advancement of Science (AAAS). His awards include the 2006 IEEE Kiyo Tomiyasu Medal for contributions to device technology for communication systems and the 2015 SRC Technical Excellence Award for fundamental contributions to reliability physics.