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Rose-Hulman University Mechanical Engineering |
Studies in PZT Piezoelectrics
Project Objectives
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Study effects of different polishing methods on crystal structure. -
Pole sample and look at crystal structure through XRD. -
Measure index of refraction of thin sample with a laser. -
Polish samples until thin enough for transmission XRD. -
Analyze XRD data and plot Multiples of a Random Distribution (MRD) data showing material poling. -
Analyze XRD data and plot MRD data showing effects of different poling fields on total poling.
Experimental Approach
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Used various polishing wheels in the polishing lab to prepare samples. -
Produced various small apparatuses such as a poling clip, an offset holder for the XRD machine, and a sample holder to allow translation of two elements of PZT perpendicular to a laser beam. -
Used the Area Diffraction XRD machine to look at crystal structures.
Research Findings
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Found that most samples need to be finish polished with 0.05-micron alumina in order to produce the same texture as an annealed sample. -
Poled texture of K550 PZT was clearly shown in XRD machine (See Figure 1 below). -
Index of refraction measurements were inconclusive because samples scattered the laser light with no bright spots. -
Sample polishing yielded a sample that was 20-25 percent thinner, but shattered due to epoxy expansion in acetone removal. Transmission XRD results were inconclusive because of possibility of X-ray reflection from micro-cracks. -
MRD plots showed the effects of poling on the distribution of domains in the samples (See Figure 2 below). 

Final Research Presentation
