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Results of Purdue-Notre Dame Research Unveiled at RSNA

Veo Product Introduction at RSNA
(L-R): Zhou Yu (Purdue ECE PhD 2009)- GE Healthcare, Jean-Baptiste Thibault (ND EE PhD 2006)- GE technical project leader, Purdue Professor Charles Bouman, Jiang Hsieh- GE responsible for project conception. Ken Sauer, professor from Notre Dame, is absent from photo.
A two-decade, Purdue-Notre Dame research collaboration that resulted in the development of a model based iterative reconstruction algorithm for CT was unveiled at a recent Radiological Society of North America annual meeting.

GE Healthcare, in conjunction with Purdue Professor Charles Bouman and Notre Dame Professor Ken Sauer, developed this newest low-dose technology – a model-based iterative reconstruction (MBIR) technology called Veo currently available in Europe. It is 510(k) pending at FDA and not yet available for sale in the U.S. When compared to previous GE reconstruction methods, Veo’s capabilities “change the rules” of CT imaging by applying revolutionary new modeling techniques to deliver lower noise, resolution gain, improved low contrast detectability and artifact suppression.

“Since the launch of healthymagination, GE Healthcare has worked with caregivers and organizations around the world to develop innovative technologies to better address the needs of healthcare providers and their patients,” said John Dineen, President and CEO of GE Healthcare. “This year, the company will showcase the results of this shared commitment in several areas of care including CT, X-ray and Healthcare IT, among others, all meant to foster providers’ ability to deliver better healthcare to more people at a lower cost.”