October 6, 2025

Purdue ECE Prof. Irith Pomeranz receives IEEE TTTC Lifetime Contribution Medal

Irith Pomeranz, the Cadence Professor in the Elmore Family School of Electrical and Computer Engineering, has been honored with the prestigious IEEE TTTC Lifetime Contribution Medal in recognition of her groundbreaking contributions to test technology.
Two individuals stand on a stage with a dark curtain backdrop. They are smiling warmly as they shake hands, with one holding a medal. The atmosphere is celebratory.
Irith Pomeranz, left, receives the IEEE Test Technology Technical Council Lifetime Contribution Medal from Yervant Zorian, right, president of the IEEE Test Technology Technical Council. (Photo provided by Cali Griebel Photography)

Irith Pomeranz, the Cadence Professor in the Elmore Family School of Electrical and Computer Engineering, has been honored with the prestigious Institute of Electrical and Electronics Engineers (IEEE) Test Technology Technical Council (TTTC) Lifetime Contribution Medal in recognition of her groundbreaking contributions to test technology. The award was presented during the 2025 International Test Conference Sept. 23.

A pioneer in electronic design automation, Pomeranz has produced seminal research in test, diagnosis and design-for-test of very large-scale integration digital circuits and systems. Her work has consistently contributed to improving the efficiency and effectiveness of semiconductor testing — a key factor in the global competitiveness of the high performance computing and automotive industries — and a cornerstone of the Purdue Computes initiative, which drives research and innovation in computing, AI, semiconductors and cybersecurity.

She developed first-in-class test compaction methods that significantly enhanced the ability to achieve comprehensive defect detection for evolving fabrication technologies while reducing storage needs and test application times. She introduced methods for further reducing storage needs by leveraging stored test data to form multiple tests, accommodating limited test application times by prioritizing target faults.

“It is a tremendous honor to be included among the very prominent individuals, from both academia and industry, who have received the TTTC Lifetime Contribution Medal,” Pomeranz said. “I was fortunate to interact with many of them professionally from the very beginning of my career. To become one of them is incredible.”

Pomeranz has published more than 700 articles in leading IEEE and Association for Computing Machinery journals and conferences, establishing a record of remarkable depth and impact. She was named an IEEE fellow in 1999, an IEEE Computer Society Golden Core member in 2006 and a ScholarGPS Highly Ranked Scholar in 2024.

 

Source: Pomeranz receives IEEE TTTC Lifetime Contribution Medal for advancements in semiconductor test technology