Professor Edward Delp receives 2017 SPIE Technology Achievement Award

Ed Delp
Professor Edward Delp has received the 2017 SPIE Technology Achievement Award. The SPIE Technology Achievement award is awarded annually to recognize outstanding technical accomplishment in optics, electro-optics, photonic engineering, or imaging.

The SPIE Awards Committee made this recommendation in recognition of Delp's pioneering work in multimedia security including watermarking and device forensics, and for his contributions to image and video compression.