MSE Electron Microscopy Facilities Suite/B214
Within the B200 Suite of the Neil Armstrong Hall of Engineering (ARMS), the School of Materials Engineering
has wide range of scanning electron microscopes (SEMs) and transmission electron microscopes (TEMs) that are available to Purdue Affiliated and outside users. Because these microscopes require some skill to operate, training is required prior to being given access to the equipment. This training can be obtained by taking the following classes offered by the School of Materials Engineering
Individuals planning to use these microscopes for their research are encouraged to sign up for these classes using the online forms on there respective pages well in advance.
New Reservation System: Coral
Qualified users can access the ARMS B200 suite that houses the Electron Microscopy Facility and the EM Sample Preparation Laboratory (ARMS B214)
using their Purdue ID. SEM/TEM trainees and undergraduates will be granted 8-5 M-F access only.
To get your card activated, you must: (1) Be a certified user or enrolled in the training course for one or more of the School of Materials Engineering's SEMs, TEMs, or AFMs housed within the suite, (2) Have a valid need for access to the research laboratories located within the suite, and (3) Fill out and submit all necessary information on the Card Swipe Access Web Form
. Please contact firstname.lastname@example.org
for questions or assistance.
JEOL Scanning Electron Microscope for Imaging, Backscatter Imaging, EDS (with ultra thin window) ARMS B205
JEOL Analytical Scanning Electron Microscope, Backscatter Imaging, EDS, ARMS B216
FEI XL40 Scanning Electron Microscopy by FEI, Schottky FEG with EDS and EBSD, ARMS B218
FEI-Tecnai TEM, 80-200 kV, high resolution imaging with sub-2.4 Å point resolution, bright and dark field imaging and capture of electron diffraction patterns, located in ARMS B232
Current users of the facility include: faculty, staff, post-docs, graduate and undergraduate students. This creates a challenge for managing and maintaining the facility. We have been fortunate that our users were very cooperative, and considerate of others. However, to minimize conflicts, protect the equipment and maintain order, we ask users to familiarize themselves with our policies prior to using the facility.
The SEM and TEM facilities within Materials Engineering's Microstructural Analysis Facilities are core to many required undergraduate (MSE 335, MSE 367, MSE 440, MSE 490, HSCI 348) and graduate level classes at the university (MSE 597 [formerly MSE 581 and 583], MSE 582, MSE 640) as well as to Summer Undergraduate Research Fellowship and NSF Research Experience for Undergraduate programs. In particular, there is increasing demand for education in scanning and transmission electron microscopy in the 580 level skills classes to meet rising University needs in nanoscience and nanotechnology. MSE 640 – where TEM is taught to users who will make this a primary tool for their research – has increased its yearly enrollment steadily from 8 students to 22 students in 4 years. Students in the past several years have come from MSE, ChE, ME, ECE, IE, AAE, ABE, Chemistry, Physics, Biology and Industrial and Physical Pharmacy.
MSE 335 - Materials Characterization Laboratory
MSE 367 - Materials Processing Laboratory
HSCI 348 - Industrial Hygiene Instrumentation Techniques
MSE 440 - Materials Processing and Design II
MSE 499 - Research in Materials Engineering
MSE 581 - Introduction to Scanning Electron Microscopy
MSE 582 - Transmission Electron Microscopy Skills
MSE 583 - Energy Dispersive X-ray MicroAnalysis
MSE 640 - Transmission Electron Microscopy and Crystal Imperfections