December 12, 2019
Jie Shan receives ASPRS Fairchild Photogrammetric Award
Professor Jie Shan has been selected by the American Society for Photogrammetry and Remote Sensing (ASPRS) to receive the Fairchild Photogrammetric Award – presented by ASPRS through the ASPRS Foundation, with the support of Lockheed Martin. The purpose of the Award is to stimulate the development of the art of aerial photogrammetry in the United States.