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Professors receive Talbert Abrams Grand Award

Recipient: Associate Professor Jie Shan, Associate Professor James S. Bethel and Professor Edward M. Mikhail,
Bestower: American Society for Photogrammetry and Remote Sensing (ASPRS)
Ceremony / Location: ASPRS 2007 Annual Conference in Tampa, Florida
Associate Professor Jie Shan, Associate Professor James S. Bethel, Professor Edward M. Mikhail, Chiumng-Shiuan Fu, Bin Li, and Jeffrey Kretsch received Talbert Abrams Grand Award for their journal paper, entitled "Principles and Evaluation of Autostereoscopic Photogrammetric Measurement."
Associate Professor Jie Shan, Associate Professor James S. Bethel, Professor Edward M. Mikhail, Chiung-Shiuan Fu, Bin Li, and Jeffrey Kretsch received the Talbert Abrams Grand Award for their journal paper, entitled "Principles and Evaluation of Autostereoscopic Photogrammetric Measurement", published in Photogrammetric Engineering and Remote Sensing, 2006, 72(4): 365-372.  This paper studies the principles of autostereoscopic technologies (obtaining stereoscopic effect without wearing glasses), the fundamental issues in using this technology for visualization and photogrammetry, and the performance of autostereoscopic photogrammetric measurement.

Named after one of North America's pioneers in early aerial photography and mapping technology, the Talbert Abrams Grand Award is one of the most prestigious and recognized prizes given to researchers in the mapping and remote sensing community today. The award presentation will take place at the American Society for Photogrammetry and Remote Sensing (ASPRS) 2007 Annual Conference in Tampa, Florida, May 9th, 2007. ASPRS is the largest scientific association in the area of remote sensing and photogrammetry with over 7,000 members around the world.