Jie Shan receives ASPRS Fairchild Photogrammetric Award
Professor Jie Shan has been selected by the American Society for Photogrammetry and Remote Sensing (ASPRS) to receive the Fairchild Photogrammetric Award – presented by ASPRS through the ASPRS Foundation, with the support of Lockheed Martin. The purpose of the Award is to stimulate the development of the art of aerial photogrammetry in the United States.
The Award consists of a silver presentation plaque mounted on a walnut wood panel. Eligibility to receive the Award is restricted to current ASPRS members who have been members for at least three years prior to the date of selection as recipient. It will be presented to Professor Shan at the ASPRS annual conference in March.