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    Jeff Maas - Engineer, US Navy


    BSEE - Brigham Young University 2006
    Ph.D. - Purdue University, 2012


    New designs in Mass Spectrometry/Chemical Sensors




    Refereed Journal Articles

    [1] W. Xu, J. Maas, F. J. Boudreau, W.J. Chappell, Z. Ouyang; "Nondestructive Ion Trap Mass Analysis at High Pressure," Analytical Chemistry 2011 83 (3), 685-689

    [2] J.D. Maas, P.I. Hendricks, Zheng Ouyang, R.G. Cooks, and W.J. Chappell, "Miniature Monolithic Rectilinear Ion Trap Arrays by Stereolithography on Printed Circuit Board," Microelectromechanical Systems, Journal of , vol.19, no.4, pp.951-960, Aug. 2010 doi: 10.1109/JMEMS.2010.2048554

    [3] M. Fico, J. Maas, S. Smith, A. Costa, Z. Ouyang, W. Chappell and R.G. Cooks, “Circular arrays of polymer-based miniature rectilinear ion traps,”  Analyst, 134, pp 1338-1347, 2009

    [4] D. Austin, M. Wang, S. Tolley, J. Maas, A. Hawkins, A. Rockwood, H. Tolley, E. Lee, and, M. Lee, “Halo ion trap mass spectrometer,” Analytical Chemistry, 79(7), 2927-2932, 2007

    [5] S. Wang, A. Barman, H. Schmidt, J. Maas, A. Hawkins, S. Kwon, B. Harteneck, S. Cabrini, and J. Bokor, “Optimization of nano-magneto-optic sensitivity using dual dielectric layer enhancement,” Appl. Phys. Lett. 90, 252504, 2007

    [6] A. Barman, S. Wang, J. Maas, A. R. Hawkins, S. Kwon, J. Bokor, A. Liddle, and H. Schmidt, “Size dependent damping in picosecond dynamics of single nanomagnets,“ Appl. Phys. Lett. 90, 202504, 2007
    [7] A. Barman, S. Wang, J. D. Maas, A. R. Hawkins, S. Kwon, A. Liddle, J. Bokor, and H. Schmidt, "Magneto-optical observation of picosecond dynamics of single nanomagnets," Nano Letters, vol. 6, No. 12, pp 2939 - 2944


    Conference Papers
    [1] J. Maas and W. Chappell, "RF Planar Ion Trap for Chemical Sensing," To be presented at IEEE International Microwave Symposium, June 5-10, Baltimore, MD, (2011).
    [2] J. Maas, Z. Ouyang, and W. Chappell, "Towards the On Chip Miniature RF Ion Trap for Chemical Detection," Presented at the Government Microcircuit Applications and Critical Technology Conference, March 21-24, Orlando, FL, (2011).
    [3] H. H. Sigmarsson, E. Binkerd, J. Maas, J. Lee, D. Peroulis, and W. J. Chappell, “Practical Implementation of Frequency Monitoring for Widely Tunable Bandpass Filters,” Proceedings of International Symposium on Microelectronics, International Microelectronics and Packaging Society (IMAPS), Raleigh, USA, 2010, pp. 874-880.
    [4] J. Maas, W. Xu, and W. Chappell, " Miniature Radio Frequency Ion Trap Mass Spectrometry," Presented at IEEE International Microwave Symposium, May 23-28, Anaheim, CA, (2010).
    [5] W. Xu, J. Mass, and W. Chappell, "Multi-Physics Simulation for Radio Frequency Ion Trap Chemical Sensing, " Proc. of Union Radio Scientifique Internationale (URSI), Chicago, IL, no. BK.8, Aug. 2008.

    [6] H. Schmidt, A. Barman, S. Wang, J. Maas, A.R. Hawkins, S. Kwon and J. Bokor, "Magneto-optical observation of picosecond dynamics in single nanomagnets (Invited)," Symposium on "Magnetization dynamics in nanomagnets", 52nd MMM Conference, Tampa, FL, November 5-9, (2007).

    [7] A. Barman, S. Wang, J. Maas, A. R. Hawkins, S. Kwon, and H. Schmidt, "Size (aspect ratio) dependent damping of precessional dynamics in individual single domain nanomagnets," 10th Joint Intermag/MMM Conference, January 7-11, Baltimore, MD, (2007).

    [8] S. Wang, A. Barman, J. Maas, A. R. Hawkins, S. Kwon, and H. Schmidt, "Demonstration of ultra-high MOKE sensitivity for nanomagneto-optics using dual layer nanofabrication process," 10th Joint Intermag/MMM Conference, January 7-11, Baltimore, MD, (2007).

    [9] S. Wang, A. Barman, J. Maas, A. R. Hawkins, and H. Schmidt, "Thickness dependence of ultrafast magnetization dynamics in Nickel films," 10th Joint Intermag/MMM Conference, January 7-11, Baltimore, MD, (2007).

    Conference Presentations

    [1] J. Maas, S. Smith, Z. Ouyang, R.G. Cooks, W. Chappell, “Miniature monolithic rectilinear ion traps and arrays by stereo-lithography on printed circuit board (SLA-on-PCB),” American Society of Mass Spectrometry, Philadelphia, PN, May 31-June 4, 2009


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