Contents

Publications

Presentation


PUBLICATIONS

Books, Book Chapters, and Editorships:

  1. Co-editor with Paulo Ferriera and Kazutaka Mitsuishi of the February 2008 Materials Research Society Bulletin on "In-situ Transmission Electron Microscopy".
  2. In situ nanoindentation in a transmission electron microscope; Andrew Minor, Eric A. Stach and J.W. Morris, Jr., in Dislocations in Solids, vol. 13, ed. by F.R.N. Nabarro and J.P. Hirth.
  3. Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure; edited by D. Martin, D.A. Muller, E.A. Stach, P. Midgley, Proceedings of the Materials Research Society, Volume 839, 2005.
  4. Current Issues in Heteroepitaxial Growth -- Stress Relaxation and Self Assembly; edited by E.A. Stach, E. Chason, R. Hull and S.M. Bader, Proceedings of the Materials Research Society, Volume 696, 2002. Principal editor.
  5. Guest Editor - "Problem Solving using In-situ Transmission Electron Microscopy", Microscopy and Microanalysis, Volume 7(6), November / December 2001.
  6. Strain accommodation and relief in SiGe / Si heteroepitaxy; book chapter by R. Hull and E.A. Stach in Thin Films: Heteroepitaxial Systems volume 15 of Directions in Condensed Matter Physics, edited by A. W. Liu and M. B. Santo, World Scientific Publishing Co., Inc., Rivers Edge, NJ, 1999.

Invited Review Articles

  1. Real time transmission electron microscopy; Eric A. Stach, Materials Today, in press.
  2. Effect of twin plane spacing on the deformation of copper containing a high density of growth twins; Z.W. Shan, L. Lu, A.M. Minor, E. A. Stach and S. X. Mao, invited article to JOM, May, 2008.
  3. Visualizing the behavior of dislocations - seeing is believing, Ian M. Robertson, Paulo J. Ferreira, Gerhard Dehm, Robert Hull and Eric A. Stach, Materials Research Society Bulletin, 33, 122-131, 2008.
  4. Dislocations in semiconductors; E.A. Stach and R. Hull, review article in Encyclopedia of Materials: Science and Technology, ed. K.H.J. Jurgen Bushow, R.W. Cahn, M.C. Flemings, B. Ilschner, E.J. Kramer and S. Mahajan, Pergamon Press, Amsterdam, 2001.
  5. Equilibrium and metastable strained layer semiconductor heterostructures; R. Hull and E.A. Stach; Current Opinion in Solid State and Materials Science, 1(1), 21-8, 1996.

Refereed Journal Articles:

  1. Kinetics of individual nucleation events observed in nanoscale vapor-liquid-solid growth; B. J. Kim, J. Tersoff, S. Kodambaka, M. C. Reuter, E. A. Stach and F. M. Ross, in press at Science, October 2008.
  2. Nanometer-scale sharpness in corner-overgrown heterostructures; L. Steinke, D. Zakharov, P. Cantwell, A. Fontcuberta i Morral, M. Bichler, G. Abstreiter, E.A. Stach and M. Grayson, in press, Applied Physics Letters, August, 2008.
  3. Micron-scale friction and sliding wear of polycrystalline silicon thin structural films in ambient air; D.H. Alsem, M.T. Dugger, E.A. Stach and R.O. Ritchie, J. Microelectromechanical Systems, 17(5), 1144 - 1154, 2008.
  4. Double-walled boron nitride nanotubes grown by floating chemical vapor deposition; M. J. Kim, S. Chatterjee, S. M. Kim, E. A. Stach, M. Bradley, M. Pender, L. Sneddon and B. Maruyama, in Nano Letters, 8(10); 3298-3302, 2008. DOI: 10.1021/nl8016835
  5. Development of CuInSe2 nanocrystal and nanoring inks for low-cost solar cells; Qijie Guo, Suk Jun Kim, Mahaprasad Kar, William Shafarman, Robert Birkmire, Eric A. Stach, Rakesh Agrawal and Hugh W. Hillhouse, Nano Letters, 8(9); 2982-2987, 2008. DOI: 10.102/nl802042g
  6. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscopy with 0.5 information limit; C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, S. Uhlemann, H. Mller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E. A., T. Donchev, E.A. Kenik, A. Lupini, J. Bentley, S. Pennycook, I.M. Anderson, A.M. Minor, A.K. Schmid, T. Duden, V. Radmilovic, Q. Ramasse, M. Watanabe, R. Erni, E.A. Stach, P. Denes and U. Dahmen, Microsc. Microanal. 14, 454-462, 2008.
  7. Organometallic vapor phase epitaxial growth of GaN on ZrN / AlN / Si substrates; Mark H. Oliver, Jeremy L. Schroeder, David A. Ewoldt, Isaac H. Wildeson, Vijay Rawat, Robert Colby, Patrick R. Cantwell, Eric A. Stach, and Timothy D. Sands, Appl. Phys. Lett., 93, 023109, 2008.
  8. Protein-templated semiconductor nanoparticle chains; S. Padalkar, J.D. Hulleman, S.M. Kim, J.C. Rochet, E.A. Stach and L.A. Stanciu, Nanotechnology, 19(27) 275602, 2008.
  9. Molecular beam epitaxy growth of InAs and In0.8Ga0.2As channel materials on GaAs substrate for metal oxide semiconductor field effect transistor applications; N. Li, E.S. Harmon, D.B. Salzman, D.N. Zakharov, J.H. Jeon, E. Stach, J.M. Woodall, X.W. Wang, T.P. Ma and F. Walker, J. Vac. Sci. Tech. B., 26(3) 1187-1190, 2008.
  10. Effect of post-release sidewall morphology on the mechanical properties of polycrystalline silicon structural films; D. H. Alsem, S. Timpe, B. L. Boyce, M. T. Dugger, E. A. Stach, K. Komvopoulos and R. O. Ritchie, Sensors and Actuators A, 147, 553-560, 2008.
  11. Further considerations on high-cycle fatigue of micron-scale polycrystalline silicon; D.H. Alsem, C.L. Muhlstein, E.A. Stach and R.O. Ritchie, in press at Scripta Materialia, January 2008.
  12. Large lattice strain in individual grains of deformed nanocrystalline Ni; Zhiwei Shan, E.A. Stach, J.M.K Wiezorek, D.M. Follstaedt, J.A. Knapp E.A. Stach and S.X. Mao, Applied Physics Letters, 92, 091917, 2008.
  13. Inter- and intra-grain agglomerate fracture in nanocrystalline nickel; Zhiwei Shan, J.A. Knapp, D.M. Follstaedt, E.A. Stach, J.M.K Wiezorek, and S.X. Mao, Physical Review Letters, 100, 105502, 2008.
  14. Peeling force spectroscopy: exposing the adhesive nanomechanics of one-dimensional nanostructures: M. C. Strus, L. Zalamea, A. Raman, R. B. Pipes, C. V. Nguyen, and E. A. Stach, Nano Lett., 8 (2), 544 -550, 2008.
  15. Electrical properties of ZnO nanowire field effect transistors by surface passivation; Woong-Ki Hong, Bong-Joong Kim, Tae-Wook Kim, Gunho Jo, Sunghoon Song, Soon-Seen Kwon, Ahnsook Yoon, Eric A Stach, and Takhee Lee, Colloids and Surfaces A: Physicochem. Eng. Aspects 313-314, 378-382, 2008.
  16. Directed self-assembly of quantum structures by nanomechanical stamping using probe tips; Curtis Taylor, Euclydes Marega, Eric A Stach, Gregory Salamo, Lindsay Hussey, Martin Muoz and Ajay Malshe, Nanotechnology 19, 015301, 2008.
  17. Role of molecular surface passivation in electrical transport properties of InAs nanowires; Qingling Hang, Fudong Wang, Patrick D. Carpenter, Dmitri Zemlyanov, Dmitri Zakharov, Eric A. Stach, William E. Buhro, and David B. Janes, Nano Letters, 8(1); 49-55, 2008.
  18. Mechanisms for fatigue of micron-scale silicon structural films, D.H. Alsem, O.N. Pierron, E.A. Stach, C.L. Muhlstein and R.O. Ritchie, Advanced Engineering Materials, 9(1-2), 15-30, 2007.
  19. Nanoscale mechanisms of misfit dislocation propagation in undulated Si1-xGex/Si(100) epitaxial thin films; Chi-Chin Wu, Robert Hull and Eric A. Stach, Nanotechnology, 18, 165705, 2007.
  20. Realization of highly reproducible ZnO nanowire field effect transistors with n-channel depletion and enhancement modes, Woong-Ki Hong, Dae-Kue Hwang, Il-Kyu Park, Gunho Jo, Sunghoon Song, Seong-Ju Park, Takhee Lee, Bong-Joong Kim and Eric A. Stach, Applied Physics Letters, 90(24), 243103, 2007.
  21. Dislocation dynamics in nanocrysytalline Ni; Zhiwei Shan, E.A. Stach, J.M.K Wiezorek, D.M. Follstaedt, J.A. Knapp E.A. Stach and S.X. Mao, Physical Review Letters, 98, 095502, 2007.
  22. In situ nanoindentation in the TEM, O.L. Warren, Z. Shan; S.A.S. Asif, E.A. Stach, J.W. Morris, Jr., and A.M. Minor, Materials Today, 10(4), 59-60, 2007.
  23. An electron microscopy study of wear in polysilicon microelectromechanical systems; D.H. Alsem, E.A. Stach, M.T. Dugger, M. Enachescu and R.O. Ritchie, Thin Solid Films, 515, 3259, 2007.
  24. Alpha-synuclein as a template for the synthesis of metallic nanowires; Sonal Padalkar, Robert Colby, Parijat Deb, Kara Cunzeman, Jean-Christophe Rochet, John Hulleman, Eric A. Stach and Lia Stanciu, Nanotechnology, 18, 055609, 2007.
  25. Very high-cycle fatigue failure in micron-scale polycrystalline silicon films: effects of environment and surface oxide thickness; D.H. Alsem, R. Timmerman, B.L. Boyce, E.A. Stach, J.T.M. De Hosson and R.O. Ritchie, J. Appl. Phys., 101, 013515, 2007.
  26. Dislocation-grain boundary interactions: a tribute to David Brandon; Jeff T.M. De Hosson, Wouter A. Soer, Andy M. Minor, Steven Shan, Eric A. Stach, S.A. Syed Asif, Oden L. Warren, J. Mat. Sci., 41, 7704-7719, 2006.
  27. Quantifying the onset of plasticity at the nanoscale; A.M. Minor, S.A. Syed Asif, Z.W. Shan, E.A. Stach, E. Cyrankowski, T. Wyrobek and O. Warren, Nature Materials, 5(9) 697-702, 2006. doi:10.1038/nmat1714.
  28. Graphene-based composite materials; S. Stankovich, D.A. Dikin, G. Dommett, K. M. Kohlhaas, E. Zimney, E.A. Stach, R.D. Piner, S.B.T. Nguyen, and R.S. Ruoff, Nature, 442, 282-286, 2006. One of Nature's "Most Downloaded" in 2006.
  29. Using EELS to observe composition and electronic structure variations at dislocation cores in GaN; I. Arslan, A. Bleloch, E. A. Stach, S. Ogut and N. D. Browning, Philosophical Magazine A, December, 86, 4727-4746, 2006.
  30. Size effects in the nanoindentation response of silicon; Daibin Ge, A. M. Minor, E.A. Stach and J.W. Morris Jr., Phil. Mag. A, 86, 4069-800, 2006.
  31. Vertical single-walled carbon nanotubes grown from porous anodic alumina templates; Matthew R. Maschmann, Aaron D. Franklin, Placidus B. Amama, Dmitri N. Zakharov, Eric A. Stach, Timothy D. Sands, Timothy S. Fisher, Nanotechnology, 17, 3925-3929, 2006.
  32. Fabrication and characterization of solid-state nanopores using a field emission scanning electron microscope; H. Chung, S.M. Iqbal, E.A. Stach, A.H. King, N.J. Zaluzec and R. Bashir, Appl. Phys. Lett., 88, 103109, 2006.
  33. Ultrastructural examination of dentin using focused ion-beam cross-sectioning and transmission electron microscopy; R. K. Nalla, A. E. Porter, C. Daraio, A. M. Minor, V. Radmilovic, E. A. Stach, A. P. Tomsia, and R. O. Ritchie, Micron, 36, 672-80, 2005.
  34. Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films; D. H. Alsem, E.A. Stach, and J. Th. M. de Hosson, Journal of Materials Science (Letters), 40(18) 5033-5036, 2005.
  35. Faceted and vertically aligned GaN nanorod arrays fabricated without catalysts or lithography; Parijat Deb, Vijay Rawat, Hogyoung Kim, Sangho Kim, Mark Oliver, Mike Marshall, Eric Stach and Timothy Sands, Nano Letters, 5(9) 1847-51, 2005. Featured in American Chemical Society's Nanofocus review as "Image of the Month".
  36. Nanoscale dislocation patterning by ultra-low load indentation; Curtis R. Taylor, Eric A. Stach, Gregory Salalmo and Ajay P. Malshe, Appl. Phys. Lett. 87, 073108, 2005.
  37. Response to comment on "Grain boundary mediated plasticity in nanocrystalline nickel"; Zhiwei Shan, E.A. Stach, J.M.K. Wiezorek, J.A. Knapp, D.M. Follstaedt, and S.X. Mao, Science, 308, 356, 2005.
  38. Morphological, spectroscopic and microstructural analysis of femtosecond laser processed lithium niobate; D.C. Deshpande, A.P. Malshe, E.A. Stach, V.R Radmilovic, D. Alexander, D. Doerr and D. Hirt, J. Appl. Phys., 97, 074316, 2005.
  39. Fatigue failure in thin-film polysilicon is due to sub-critical cracking within the oxide layer; D.H. Alsem, E.A. Stach, C.L. Muhlstein and R.O. Ritchie, Appl. Phys. Lett., 86, 041914,2005.
  40. Room temperature dislocation plasticity in silicon; A.M. Minor, E.T. Lilleodden, M. Jin, E.A. Stach, Daryl Chrzan, and J.W. Morris, Jr., Phil. Mag. A., 85(2-3), 323-330, 2005.
  41. The atomic and electronic structure of mixed dislocations in GaN; I. Arslan, A. Bleloch, E.A. Stach & N.D. Browning; Phys. Rev. Lett., 94, 025504, 2005.
  42. Dislocation-grain boundary interactions in martensitic steel observed through in situ nanoindentation in a TEM, T. Ohmura, A.M. Minor, E.A. Stach, and J.W. Morris, Jr., J. Mater. Res., 19(12), 3626-3632, 2004.
  43. Direct observation of stress-induced grain growth during the indentation of ultra-fine grained aluminum, M. Jin, A.M. Minor, E.A. Stach and J.W. Morris, Jr., Acta Mat. 52(18) 5381-87, 2004.
  44. The effect of solute Mg on grain boundary and dislocation dynamics during nanoindentation of Al-Mg thin films, W.A. Soer, J.Th.M. De Hosson, A.M. Minor, J.W. Morris, Jr. and E.A. Stach, Acta Materialia, 52, 5783-90, 2004.
  45. Characteristic dimensions and the micro-mechanisms of fracture and fatigue in 'nano' and 'bio' materials; R.O. Ritchie, J.J. Kruzic, C.L. Muhsltein, R.K. Nalla and E.A. Stach, Inter. J. Fracture 128, 1-15, 2004
  46. A mechanistic understanding of fatigue in polysilicon structural thin-films; R.O. Ritchie, D.H. Alsem, E.A. Stach and C.L. Muhlstein, Journal of Materials, 56(11) 192, 2004.
  47. Grain boundary mediated plasticity in nanocrystalline nickel; Z.W. Shan, E.A. Stach, J.M.K Wiezorek, J.A. Knapp, D.M. Follstaedt and S.X. Mao, Science, 305, 654-7, 2004.
  48. Structural changes of boron carbide under contact loading; D. Ge, V, Domnich, T. Juliano, Y. Gogotsi and E.A. Stach, Acta Mat. 52(13), 3921-7, 2004.
  49. Direct observations of incipient plasticity during nanoindentation of Al; A.M. Minor, E.T. Lilleodden, E.A. Stach and J.W. Morris, Jr., J. Mater. Res., 19(1) 176-82, 2004.
  50. Metal delocalization and surface decoration in direct-write nanolithography by electron beam induced deposition, V. Gopal, E.A. Stach, V.R. Radmilovic, and I.A. Mowat, Appl. Phys. Lett., 85(1), 49-51, 2004.
  51. Rapid prototyping of site-specific nanocontacts by electron and ion beam assisted direct-write nanolithography; V. Gopal, C. Daraio, S. Jin, P. Yang and E.A. Stach, Nano Letters, 4(11), 2059-2063, 2004.
  52. Using the FIB to characterize nanoparticle materials; C.R. Perrey, C.B. Carter, J. Michael, P. Kotula, E.A. Stach, and V.R. Radmilovic, J. Microsc., 214(3) 222-236, 2004.
  53. Surface characterization of metal nanoparticles; X. Phung, J.R. Groza, E.A. Stach, L.N. Williams, Mat. Sci. Eng A, 359, 261-8, 2003.
  54. Formation of a few nanometer wide holes in membranes with a dual beam focused ion beam system; T. Schenkel, V. Radmilovic, E. A. Stach, S.-J. Park, and A. Persaud, J. Vac. Sci. Technol. B 21(6), 2720-3, 2003.
  55. An off-normal fiber-like texture in thin films on single crystalline substrates; C. Detavernier, A.S. zcan, J. Jordan-Sweet, E.A. Stach, J. Tersoff, F.M. Ross, C. Lavoie, Nature, 426, 641-5, 2003.
  56. Nanoscale surface and subsurface defects induced in lithium niobate by a femtosecond laser; E.A. Stach, V.R Radmilovic, D.C. Deshpande, A.P. Malshe, D. Alexander, D. Doerr, Appl. Phys. Lett., 83 (21) 4420-2, 2003.
  57. In-situ nanoindentation of epitaxial TiN / MgO (100) in a transmission electron microscope; A.M. Minor, E.A. Stach, J.W. Morris, Jr. and I. Petrov, J. Elect. Mat., 32(10), 1023-7, 2003.
  58. Fatigue problems of the future: high-cycle fatigue failures of silicon MEMS; C. L. Muhlstein, E. A. Stach, and R. O. Ritchie, J. Eng. Integrity Soc., 14, 4-12, 2003.
  59. Watching GaN nanowires grow; E.A. Stach, P. Pauzauskie, T. Kuykendall, J. Goldberger and P. Yang, Nano Letters, 3(6), 867-9, May 2003.
  60. On the origin of the orientation ratio in sputtered longitudinal media; B. G. Demczyk, J. N. Zhou, G. Choe, E.A. Stach, E.C. Nelson and U. Dahmen, J. Appl, Phys., 93(10) 7393-5, 2003.
  61. An in situ transmission electron microscopy study of the thermal stability of near-surface microstructures induced by deep rolling and laser-shock peening; I. Altenberger, E. A. Stach, G. Y. Liu, R. K. Nalla and R. O. Ritchie, Scripta Mater., 48, 1593-98, 2003.
  62. Nitride mediated epitaxy of CoSi2 on Si(001); R.K.K. Chong, M. Yeadon, W.K. Choi, E.A. Stach and C.B. Boothroyd, Appl. Phys. Lett. 82(12) 1833-5, 2003.
  63. In situ TEM study of the nanoindentation behavior of Al; A.M. Minor, E.T. Lilleodden, E.A. Stach and J.W. Morris, Jr., J. Elect. Mat., 31 (10), 958-964, 2002.
  64. Electromigration in passivated Cu interconnects studied by transmission x-ray microscopy; G. Schneider, M.A. Meyer, G. Denbeaux, E. Anderson, B. Bates, A. Pearson, C. Knchel, D. Hambach, E. A. Stach and E. Zschech, J. Vac. Sci. Tech. B, 20 (6), 3089-3094, 2002.
  65. Dynamical x-ray microscopic investigations of electromigration of passivated inlaid Cu interconnect structures; G. Schneider, G. Denbeaux, E. H. Anderson, B. Bates, A. Pearson, M. A. Meyer, E. Zschech, D. Hambach, and E. A. Stach, Appl. Phys. Lett., 81(14), 2535-2537, 2002.
  66. A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading; C.L. Muhlstein, E.A. Stach, and R.O. Ritchie, Acta Mater., 50, 3579-3596 2002.
  67. Mechanism of fatigue in micron-scale films of polycrystalline silicon for MEMS applications; C.L. Muhlstein, E.A. Stach, and R.O. Ritchie, Appl. Phys. Lett., 80(9), 1532-4, 2002. Selected by Nature Physics Editor as a "Research Highlight" for March, 2002.
  68. Nitrogen effects on the crystallization kinetics of amorphous TiOxNy thin films; K. Hukari, R. Dannenberg and E.A. Stach, J. Mater. Res. 17(3), 550-555, 2002.
  69. Development of a nanoindenter for in-situ transmission electron microscopy; E. A. Stach, T. Freeman, A. M. Minor, D. K. Owen, J. Cumings, M. A. Wall, T. Chraska, R. Hull, J.W. Morris, Jr., A. Zettl and U. Dahmen, Microscopy and Microanalysis, 7(6) 507-517, 2001.
  70. Quantitative in-situ nanoindentation of aluminum thin films; A.M. Minor, J.W. Morris Jr. and E.A. Stach, Appl. Phys. Lett, 79 (11), 1625-27, 2001.
  71. Enhancement of dislocation velocities by stress assisted kink nucleation at the native oxide / SiGe interface; E.A. Stach and R. Hull, Appl. Phys. Lett., 79(3), 335-7, 2001.
  72. Microstructural properties of (Ba,Sr)TiO3 films fabricated from BaF2/SrF2/TiO2 amorphous multilayers; I. Takeuchi, K. Chang and R. P. Sharma, L. Bendersky, H. Chang, X.-D. Xiang, E.A. Stach, and C.-Y. Song, J. Appl. Phys., 90, 2474-8, 2001.
  73. Phenomenological description of grain growth stagnation for nanocrystalline films and powders; R. Dannenberg, E. A. Stach and J.R. Groza, J. Mater. Res., 16(4), 1090-5, 2001.
  74. A tilting procedure to enhance compositional contrast and reduce residual Bragg contrast in EFTEM imaging of planar interfaces; K.T. Moore, E.A. Stach, J.M. Howe, D.C. Elbert, D.R. Veblen, Micron, 33(1), 39-51, 2001.
  75. A new mechanism for dislocation blocking in strained layer epitaxial growth; E. A. Stach, R. Hull, K. W. Schwarz, F. M. Ross and R.M. Tromp, Phys. Rev. Lett. 84(5), 947, 2000.
  76. Structural and chemical characterization of free-standing GaN films separated from sapphire substrates by laser lift-off; E.A. Stach, M. Kelsch, E.C. Nelson, W.S. Wong, T. Sands and N.W. Cheung, Appl. Phys. Lett., 77 (12) 1819, 2000.
  77. In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe / Si (001) heterostuctures; E. A. Stach, R. Hull, R. M. Tromp, F. M. Ross and M. C. Reuter, and J. C. Bean, Phil. Mag. A, 80, 2159, 2000.
  78. In-situ TEM observations of normal grain growth in nanocrystalline Ag thin films; R. Dannenberg, E.A. Stach, J.R. Groza, and B.J. Dresser, Thin Solid Films 379(1-2) 133-8, 2000.
  79. In-situ TEM observations of abnormal grain growth, coarsening and substrate de-wetting in nanocrystalline Ag films; R. Dannenberg, E.A. Stach, J.R. Groza and B.J. Dresser, Thin Solid Films 370 (1-2), 54, 2000.
  80. Characterization of twin defects formed during GaAs(111)B MBE growth; Y. Park, M. Cich, R. Zhao, P. Specht, E.R. Weber, E.A. Stach, and S. Nozaki, J. Vac. Sci and Tech. B, 18 (3), 1566, 2000.
  81. Interactions of moving dislocations in semiconductors with point, line and planar defects; R. Hull, E.A. Stach, R. M. Tromp, F. M. Ross and M. C. Reuter, phys. stat. sol. (a), 171 (1), 133, 1999.
  82. Analysis of electron intensity as a function of aperture size in energy-filtered transmission electron microscopy imaging; K.T. Moore, J.M. Howe, D.R. Veblen, T.M. Murray and E.A. Stach, Ultramicroscopy, 80 (3) 231, 1999.
  83. Effect of the surface upon misfit dislocation velocities during the growth and annealing of SiGe / Si (001) heterostructures; E. A. Stach, R. Hull, R. M. Tromp, M. C. Reuter, M. Copel, F. K. LeGoues, and J. C. Bean, J. Appl. Phys. 83 (4), 1931, 1998.
  84. In-situ studies of the interaction of dislocations with point defects during annealing of ion implanted Si / SiGe / Si (001) heterostructures; E. A. Stach, R. Hull, J. C. Bean, K. S. Jones, and A. Nejim, Microscopy and Microanalysis 4 (3), 294, 1998.
  85. Applications of in-situ electron and ion microscopy to the study of electronic materials and devices; R. Hull, J. Demarest, D. Dunn, Y. Quan and E. A. Stach, Microscopy and Microanalysis 4 (3), 308, 1998.
  86. Suppression of boron transient enhanced diffusion in SiGe heterojunction bipolar transistors by carbon incorporation; L. D. Lanzerotti, J. C. Sturm, E. Stach, R. Hull, T. Buyuklimanli and C. Magee, Appl. Phys. Lett. 70 (23) 3125, 1997.

Un-refereed journal articles

  1. Nanotubes reveal their true strength; Eric Stach, Nature Nanotechnology, in press, 2008.
  2. Hardware and techniques for cross-correlative TEM and atom probe analysis; Brian P. Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, Cheryl Hartfield, Microscopy Today, 16(8), 42-47, 2008.

Conference Papers

  1. Nano-scale tribological behavior of polycrystalline silicon structural films in ambient air; D.H. Alsem, R. van der Hulst, E.A. Stach, M.T. Dugger, J.Th.M. de Hosson and R.O. Ritchie, Spring 2008 MRS meeting Proceedings.
  2. Nanoindentation assisted self-assembly of quantum dots, Curtis R. Taylor, Eric A. Stach, Gregory Salamo and Ajay P. Malshe, Proceedings of MSEC, 2006 ASME International Conference on Manufacturing Science and Engineering, October 8-11, 2006, Ypsilanti, Michigan.
  3. Wear and fatigue in silicon structural films for MEMS applications, D.H. Alsem, R. Timmerman, E.A. Stach, M.T. Dugger and R.O. Ritchie, Alexandroupolis, Greece, July 3-7, 2006.
  4. Modular MEMS experimental platform for transmission electron microscopy; N. Sarkar, C. Baur, E. Stach, Z. Jandric, R. Stallcup, M. Ellis, G. Skidmore, J. Liu and G.K. Fedder, 19th IEEE Int. Conf. on Micro Electro Mechanical Systmes (MEMS 2006), Istanbul, 2006.
  5. Analysis of nanoscale deformation in GaAs(100): towards patterned growth of quantum dots; Curtis R. Taylor, Eric A. Stach, Ajay P. Malshe, and Gregory Salamo, submitted to "Semiconductor Defect Engineering-Materials, Synthetic Structures, and Devices", Spring 2005 MRS meeting, San Francisco, CA
  6. In-situ electron microscopy studies of the effect of solute segregation on grain boundary anisotropy and mobility in an Al-Zr alloy; M.L.Taheri, E.A. Stach, V.R. Radmilovic; H. Weiland, A.D. Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure. Symposium, 187-93, 2005
  7. In-situ nanoindentation: a novel technique for understanding nanoscale deformation mechanisms; E.A. Stach, A. Minor, D. Ge, M. Jin, W.A. Soer, J.Th. De Hossen, and J.W. Morris, Proc. Inter. Conf. Fracture, Turin, Italy, March 2005.
  8. In-situ electron microscopy studies of the effect of solute segregation on grain boundary anisotropy and mobility in an Al-Zr alloy; M. Taheri, A.Rollet, V.R. Radmilovic and E.A. Stach, submitted to Proc. Mat. Res. Soc., December, 2005.
  9. In-situ electron microscopy studies of the effect of Zr on grain boundary anisotropy and mobility in an aluminum alloy; M.L. Taheri, Eric Stach, V.R. Radmilovic, H. Weiland and A.D. Rollett, Mat. Res. Soc. Symp. Proc., (2004) P7.7.
  10. Investigation of Femtosecond Laser-assisted Micromachining of Lithium Niobate, A. Malshe, D. Deshpande, E.A. Stach, et al., CIRP Annals vol 53, pp 187-191, August 2004.
  11. Utilizing on-chip testing and electron microscopy to obtain a mechanistic understanding of fatigue and wear in polysilicon structural films, D.H. Alsem, E.A. Stach, C.L. Muhlstein, M.T. Dugger, and R.O. Ritchie, in press at Proc. Mat. Res. Soc., June 2004.
  12. Grain boundary phenomena observed with in-situ nanoindentation in a TEM, Andrew M. Minor, Eric A. Stach, Miao Jin, J.W. Morris, Jr., T. Ohmura, W.A. Soer, and J.Th.M. De Hosson, 8th Ultra Steel Workshop, Tsukuba, Japan, 2004.
  13. Investigation of femtosecond laser-assisted micromachining of lithium niobate; A. Malshe, D. Deshpande E.A Stach K. Rajurkar, D. Alexander, Proceedings CIRP - International Institution for Production Engineering Research, 2004.
  14. Direct observations of grain boundary phenomena during indentation of Al and Al-Mg thin films; W.A. Soer, J.Th.M. De Hosson, A.M. Minor, E.A. Stach, J.W. Morris, Jr., submitted to Thin Films: Stresses and Mechanical Properties X, Proc. Mater. Res. Soc., 2003.
  15. In-situ transmission electron microscopy experiments coupled with differential scanning calorimetry as characterization tools for thin film reactions on the nanoscale; J.M. McCarthy, F. Radulescu and E.A. Stach, Proc. The 31st Annual Conference on Thermal Analysis and Applications, Albuequerque, NM, September 2003.
  16. Formation of a few nanometer wide holes in membranes with a DualBeam FIB; T. Schenkel, V. Radmilovic, E.A. Stach, S.-J. Park and A. Persaud, proceedings of 47th International Conference on Electron, Ion, Photon Beam Technology and Nanofabrication, Tampa, Fl, May, 2003.
  17. Evolution of microstructure and defect structure in ferromagnetic manganese-aluminum base intermetallics; C. Yanar, E.A. Stach, V.R. Radmilovic, W. Soffa, J. Wiezorek, invited article, Proc. 15th Int. Cong. on Electron Microscopy (ICEM-XV); Durban, RZA, Vol 1, 679, 2002.
  18. C. Yanar, E.A. Stach, W.A. Soffa and J.M.K. Wiezorek, Proc. 15th Int. Cong. on Electron Microscopy (ICEM-XV); Durban, RZA, Vol 1, 929, 2002.
  19. Fatigue degradation of nanometer-scale silicon dioxide reaction layers on silicon; C.L. Muhlstein, E.A. Stach and R.O. Ritchie, submitted to MEMS and BioMEMS, Proceedings of the Materials Research Society, Spring 2002 Meeting.
  20. Defect formation via thermal decomposition in GaN; E.A. Stach, W.S. Wong, M. Kneissl and T. Sands; Proc. of the 4th Symposium on Non-Stoichiometric III-V Compounds, Asilomar, CA, 2002.
  21. On the mechanism of fatigue in micron-scale structural films of polycrystalline silicon; C.L. Muhlstein, E.A. Stach and R.O. Ritchie. in Materials Science of Micro-electro-mechanical Systems (MEMS) Devices IV, vol. 687 of the Proc. Mater. Res. Soc., pp.305-12. Warrendale, PA, 2002,
  22. A method for extracting quantitative data during in-situ TEM nanoindentation; A.M. Minor, E.T. Lilleodden, E.A. Stach, J.W. Morris, Thin Films: Stresses and Mechanical Properties IX, vol.695, Proc. Mater. Res. Soc., pp.165-70. Warrendale, PA, 2002.
  23. X-ray diffraction analysis and modeling of strain induced thermal cycling in a thin aluminum (001) bicrystal film; D.E. Nowak, O. Thomas, S.P. Baker, E.A. Stach, K. Balzuweit, U. Dahmen, Thin Films: Stresses and Mechanical Properties IX, vol.695, Proc. Mater. Res. Soc., pp.3-8. Warrendale, PA, 2002.
  24. On the mechanism of fatigue in micron-scale structural films of polycrystalline silicon; C.L. Muhlstein, E.A. Stach and R.O. Ritchie, in Surface Engineering 2001 - Fundamentals and Applications. vol. 657, Proc. Mater. Res. Soc., pp.227-34,Warrendale, PA 2001.
  25. In-situ TEM - a tool for quantitative observations of deformation behavior in thin films and nano-structured materials; E.A. Stach, Department of Energy, Basic Energy Sciences, Workshop on New Materials Science Enabled by In-situ Microscopies. Invited white paper.
  26. Quantitative in-situ nanoindentation of thin films in a transmission electron microscope; A.M. Minor, E.A. Stach, and J.W. Morris, Jr., Microscopy and Microanalysis, 7S, 912, 2001.
  27. Fabrication of MEMS components based on ultrananocrystalline diamond thin films and characterization of mechanical properties; A.V. Sumant, O. Auciello, A.R. Krauss, D.M. Gruen, D. Ersoy, J. Tucek, A. Jayatissa, E.A. Stach, N. Moldovan, D. Mancini, H.G. Busmann, E.M. Meyer, in Materials Science of Microelectromechanical System (MEMS) Devices II, vol. 657, Proc. Mater. Res. Soc., Warrendale, PA 2001.
  28. Development of induced crystallization as a pattern transfer mechanism for nanofabrication, T. Chraska, M.J. Cabral, S. Mesarovic, D.M. Longo, E.A. Stach, J.C. Bean, and R. Hull, in Nonlithographic and Lithographic Methods for Nanofabrication-From Ultralarge-Scale Integration to Photonics to Molecular Electronics, vol. 636 Proc. Mater. Res. Soc., Warrendale, PA p.D6.2.1-6 2001,.
  29. Real time observation and characterization of dislocation motion, nitrogen desorption and nanopipe formation in GaN; E. A. Stach, C.F. Kisielowski, W.S. Wong, T. Sands and N.W. Cheung, in Wide Band Gap Electronic Devices, ed. R.J. Shul, F. Ren, W. Pletschen, M. Murakami, vol. 622, Proc. Mater. Res. Soc., Warrendale, PA p. 27-35, 2000
  30. Real time observations of dislocation-mediated plasticity in the epitaxial Al (011) / Si (100) thin film system; E. A. Stach, U. Dahmen and W.D. Nix in Recent Developments in Oxide and Metal Epitaxy Theory and Experiment, ed. M. Yeadon, S. Chiang, R.F.C. Farrow, J.W. Evans and O. Auciello, vol. 619 Proc. Mater. Res. Soc., Warrendale, PA p. 27-35, 2000.
  31. Structural characterization of laser lift-off GaN; E.A. Stach, M. Kelsch, W.S. Wong, E.C. Nelson, T. Sands and N.W. Cheung in Laser-Solid Interactions for Materials Processing, ed. D. Kumar, D.P. Norton, C.B. Lee, K. Ebihara and X.X. Xi, vol. 617, Proc. Mater. Res. Soc., Warrendale, PA, p.J3.5.1-6, 2000.
  32. Quantitative experimental determination of the effect of dislocation - dislocation interactions on strain relaxation in lattice mismatched heterostructures; E. A. Stach, R. Hull, R. M. Tromp, F. M. Ross and M. C. Reuter, and J. C. Bean; in III-V and IV-IV Materials and Processing Challenges for Highly Integrated Microelectronics and Optoelectronics; ed. S.A. Ringel, E.A. Fitzgerald, I. Adesida, and D.C Houghton, vol. 535, Proc. Mater. Res. Soc., Warrendale, PA, p.15-20 1999.
  33. In-situ annealing transmission electron microscopy study of Pd/Gd/Pd/GaAs interfacial reactions; F. Radulescu, J.M. McCarthy and E.A. Stach, in Advances in Materials Problem Solving with the Electron Microscope, vol. 598, Proc. Mater. Res. Soc., Warrendale, PA, pp. 179-84 1999.
  34. In-situ TEM studies of the interaction of dislocations in SiGe heterostructures; E. A. Stach, R. Hull, R. M. Tromp, F. M. Ross and M. C. Reuter, Microscopy and Microanalysis, 5S, 728, 1999.
  35. Suppression of boron transient enhanced diffusion in SiGe HBTs by carbon incorporation; L. D. Lanzerotti, J. C. Sturm, E. A. Stach, R. Hull, T. Buyuklimanli and C. Magee, in Defects and Diffusion in Silicon Processing; ed. T. Diaz de la Rubia, S. Coffa, P.A. Stolk and C.S. Rafferty, vol. 469, Proc. Mater. Res. Soc., Pittsburgh, PA, p. 297-302, 1997.
  36. Suppression of boron outdiffusion in SiGe HBTs by carbon incorporation; L.D. Lanzerotti, J.C. Sturm, E. A. Stach, R. Hull, T. Buyuklimanli, C. Magee; International Electron Devices Meeting. Technical Digest 960, 249, 1996.

PRESENTATIONS

Short Courses and Tutorials:

  1. In-situ electron microscopy characterization of nanomaterials; NSF Summer Institute: A Short Course on Micro and Nano Devices with Applications to Biology and Nanoelectronics, August 7-11, 2006.
  2. Electron and ion microscopies as characterization tools for nanoscience and nanotechnology; Eric A. Stach, NCN Nanotutorial, Purdue University February 27, 2006. Lecture available at: http://www.nanohub.org/resources/?id=1097
  3. In-situ electron microscopy: a practical tutorial; E.A. Stach, tutorial lecture at the 2005 Microscopy and Microanalysis Meeting, Hawaii, July 2005.

Invited Oral Conference Presentations:

  1. Title to be determined; In-situ Studies Across Spatial and Temporal Length Scales for Nanoscience and Technology, Materials Research Society Meeting, Fall 2008.
  2. Title to be determined, Advanced Electron Microscopy in Materials Science, ORNL Workshop, November, 2008.
  3. Investigating catalyst behavior prior to and during the growth of carbon nanotubes; In-situ Electron Microscopy, AVS 55th International Symposium, October, 2008.
  4. Expanding in-situ mechanical testing into the "ultrafast" regime; Ultrafast Electron Microscopy and Ultrafast Science Symposium, Microscopy and Microanalysis Meeting, August, 2008.
  5. Kinetics of individual nucleation events observed in nanoscale vapor-liquid-solid growth; "Opportunities and Challenges for In-Situ Microscopy, User's Week 2008, Argonne National Laboratory, May, 2008.
  6. Exploiting quantitative in-situ nanoindentation to investigate the mechanisms of plastic deformation in thin films, American Ceramic Society Annual Meeting, Daytona, FL, January, 2008
  7. Declined. International Symposium on Plasticity and its Current Applications, Keahou Bay January 2008.
  8. Quantitative in-situ nanoindentaiton of thin films, Center for Electron Nanoscopy Inauguration, Denmark Technical University, Lyngby, Denmark, December 2007.
  9. Using real time electron microscopy to understand nucleation and growth in semiconducting nanowires and carbon nanotubes, Quantitative Electron Microscopy for Materials Science, Fall 2007 MRS meeting, Boston, MA, November 2007.
  10. Using real time electron microscopy to understand nucleation and growth in semiconducting nanowires and carbon nanotubes, In-situ Electron Microscopy, AVS 54th International Symposium, October, 2007.
  11. Using real time electron microscopy to understand nucleation and growth in semiconducting nanowires and carbon nanotubes, Frontiers of Electron Microscopy in Materials Science Conference, October, 2007
  12. Declined, Interamerican Congress of Electron Microscopy 2007, September 2007
  13. Using real time microscopy to understand the nucleation of nanotubes and nanowires, Ninth Annual Conference of the Yugoslav Materials Research Society, Herceg Novi, Montenegro, September, 2007.
  14. Declined, 2007 ASME Mechanics and Materials Conference, Austin, Texas, June, 2007.
  15. Why is ultra-fast imaging needed for in-situ transmission electron microscopy?, Fast Electron Gun Workshop, Argonne National Laboratory, June 5th, 2007.
  16. Using real time electron microscopy to understand nucleation and growth in semiconducting nanowires and carbon nanotubes, In Situ Studies of Interfacial Reactivity Workshop, User's Week 2007, Argonne National Laboratory, May 10, 2007.
  17. Understanding the mechanisms of single walled nanotube growth from "spin-on-catalysts" using real time imaging in the TEM, E.A. Stach, Seung Min Kim, Mark Pender, Tyson C. Back, Allison Jacques and Benji Maruyama, 2007 Workshop on Nucleation and Growth of Single Wall Carbon Nanotubes.
  18. Direct-observation nanomechanical testing in a transmission electron microscope; Oden L Warren, S. A Syed Asif, Zhiwei Shan, Andrew M Minor and Eric A Stach, Surface and Interfacial Nanomechanics Symposium, Spring 2007 MRS meeting, April 2007.
  19. Understanding the onset of plasticity in materials using quantitative in-situ nanoindentation, E.A. Stach, A.M. Minor, D. Ge, J.W. Morris, Jr., S. Asif, T. Wyrobek and O. Warren, 2007 International Conference on Metallurgical Coatings and Thin Films (ICMCTM), San Diego, April 2007.
  20. Examining small-scale plasticity and source-limited deformation through in situ TEM nanoindentation and compression tests. A.M. Minor, Zhiwei Shan, R. Mishra, E.A. Stach, S.A. Syed Asif, and O. Warren, Structural Materials Division Symposium: Mechanical Behavior of Nanostructured Materials, in Honor of Carl Koch, TMS Annual Meeting & Exhibition, Orlando, February 2007.
  21. Size effects on the deformation behavior of silicon; E.A. Stach, A.M. Minor, D. Ge, J.W. Morris, Jr., S. Asif, T. Wyrobek and O. Warren, Workshop on the Mechanical Behavior of Systems at Small Length Scales, Indian Institute of Science, Bangalore, February, 2007.
  22. In-situ electron microscopy as a tool for imaging the growth of nanostructures, S. Kodambaka, F.M. Ross, J.B. Hannon, R.M. Tromp, M.C. Reuter, A.W. Ellis, J. Tersoff, B.J. Kim and E.A. Stach, Symposium P - Semiconductor Nanowires - Fabrication, Physical Properties, and Applications, Fall 2007 Materials Research Society Meeting, Boston, MA, November, 2006.
  23. Observing mechanical behavior and crystal growth at improved time resolution: E.A. Stach, Workshop on Dynamic Transmission Electron Microscopy, Lawrence Livermore National Laboratory, Livermore, CA Aug 10 & 11, 2006.
  24. Understanding the onset of plasticity in materials using quantitative in-situ nanoindentation, E.A. Stach, A.M. Minor, D. Ge, J.W. Morris, Jr., S. Asif, T. Wyrobek and O. Warren, "In-situ electron microscopy", International Congress on Microscopy, Sapporo, Japan, September 2006.
  25. Quantitative nanoindentation in-situ to the TEM; E.A. Stach, A. Minor, Z. Shan, , M. Jin, J.W. Morris, Jr., A. Syed and O. Warren, AVS Prairie Chapter Symposium, June 2006.
  26. Examining the initial stages of plasticity through in-situ nanoindentation in a TEM, A.M. Minor, Z. Shan, E.A. Stach, M. Jin, J.W. Morris, Jr., A. Syed and O. Warren, "Mechanics of Nanoscale Materials and Devices", Spring 2006 MRS meeting, San Francisco, CA
  27. Characterization of nanomaterials; Eric Stach, Food Nanotechnology Grand Rounds, Food & Drug Administration, April 25 2006.
  28. Formation mechanism of dimpled fracture surfaces of nanocrystalline materials; Zhiwei Shan, J. Knapp, D. Follstaedt, Jorg Wiezorek, Eric Stach and Scott Mao, Ultrafine Grained Materials - Fourth International Symposium, 2006 TMS Annual Meeting.
  29. Quantitative in-situ nanoindentation of silicon, E.A. Stach, D. Ge, A.M. Minor, J.W. Morris, Jr., S. Asif, T. Wyrobek and O. Warren "In-situ electron microscopy", Fall 2005 MRS meeting, Boston MA
  30. Nanoscale probing of stress fields using the local velocity of misfit dislocations in heteroepitaxial systems; R. Hull, C.C. Wu, and E.A. Stach, "In-situ electron microscopy", Fall 2005 MRS meeting, Boston MA
  31. In-situ nanoindentation: a quantitative technique for understanding nanoscale deformation mechanisms, E.A. Stach, A. Minor, D. Ge, M. Jin and J.W. Morris, Jr., "Dynamics of Materials Revealed by Electron Microscopy", Midwest Microscopy and Microanalysis Society, Urbana, Illinois, June 2005.
  32. In-situ transmission electron microscopy studies of the deformation of nan0crystalline metals; E.A. Stach, A. Minor, D. Ge, M. Jin, J.W. Morris, Jr., Z. Shan, S.X. Mao, J.M.K. Wiezorek, D.M. Follstaedt and J.A. Knapp, China-US Workshop on Advanced Materials, May, 2005.
  33. In-situ nanoindentation of ultrananocrystalline diamond and amorphous dimond thin film coating; E.A. Stach, A.M. Minor, D. Ge, J.W. Morris, Jr., T.A. Friedmann, X. Xiao, O. Auciello, J.A. Carlisle, "Nanostructured diamond and diamond-like materials for micro- and nano-devices", Spring 2005 MRS meeting, April, 2005.
  34. Using the electron microscope to explore reliability in nanostructured materials; E.A. Stach, D. Ge, M. Jin, A. Minor, J.W. Morris, Jr., V. Gopal, and V. Radmilovic, "Thin Films - Stresses and Mechanical Properties XI", Spring 2005 MRS meeting, April 2005.
  35. In-situ nanoindentation: a novel technique for understanding nanoscale deformation mechanisms, The 10th International Symposium on Advanced Physical Fields, Nation Institute for Materials Science, Tsukuba, Japan, March 2005
  36. Using the electron microscope to explore reliability in microelectromechanical systems and nanostructured materials; E.A. Stach, V. Gopal, M. Jin, D.H. Alsem, M.J. Williamson, A. Minor, V. Radmilovic, C.L Muhlstein, J.W. Morris, Jr., and R.O. Ritchie, Microscopy and Microanalysis, Savannah, Georgia, August, 2004.
  37. In-situ nanoindentation - a unique probe of deformation response in materials; E.A. Stach, A.M. Minor, E.T. Lilleodden, M. Jin, D. Chrzan, J.W. Morris, Jr., T.A. Friedmann, X. Xiao, O.H. Auciello, and J.A. Carlisle, Microscopy and Microanalysis Meeting, San Antonio, TX, August 2003.
  38. Nanoindentation in the transmission electron microscope - a novel method for understanding mechanical deformation; A.Minor, E.A. Stach, E.T. Lilleodden, M. Jin and J.W. Morris, Plasticity 2003, Quebec City, Quebec, July 2003
  39. In-situ TEM studies of nanoindentation: a novel method for quantitatively exploring thin film mechanical behavior; E.A. Stach, A.M Minor, E.T. Lilleodden, M. Jin and J.W. Morris, Jr., American Society for Mechanical Engineering, Scottsdale, AZ, June 2003.
  40. Quantitative in-situ nanoindentation: a novel method for exploring thin film mechanical behavior; E.A. Stach, A.M Minor, E.T. Lilleodden, M. Jin and J.W. Morris, Jr., American Physical Society Meeting, Texas, March 2003.
  41. In-situ transmission electron microscopy studies of grain growth in thin films during simultaneous heating and electrical bias; E.A. Stach, X. Phung, L. Stanciu, J.R. Groza, K. Hukari, "Materials Processing Under the Influence of Electrical and Magnetic Fields" TMS Annual Meeting, San Diego, CA, March 2003.
  42. Revealing deformation mechanisms through in situ nanoindentation in a transmission electron microscope; A. M. Minor, E.T. Lilleodden, E.A. Stach, and J.W. Morris, Jr., "Materials and Processes for Submicron Technologies - III", TMS Annual Meeting, San Diego, CA, March 2003.
  43. I
  44. Ultrananocrystalline diamond for tribomechanical coatings and microelectromechanical systems; Orlando Auciello, J.A. Carlisle, J. Birrell, A. Erdemir, D.M. Gruen, D.C. Mancini, N.A. Moldovan, M.T. Dugger, and E.A. Stach, MRS Fall Meeting, December, Boston 2002.
  45. Quantitative determination of the kinetics of nanopipe growth in GaN; E.A. Stach, W.S. Wong and M. Kneissl, 4th Symposium on Non-Stoichiometric III-V Compounds, Asilomar, CA, October 2002.
  46. Quantitative in-situ nanoindentation: a novel method for exploring thin film mechanical behavior; E.A. Stach, A. Minor, E.T. Lilleodden and J.W. Morris, Jr., XI International Materials Research Congress, Cancn, Mexico, August 2002.
  47. Transmission electron microscopy in thin film mechanical property research, E.A. Stach, Chama River Workshop on Thin Film Mechanical Properties, Cuba, New Mexico, August 2002.
  48. Fatigue mechanisms in silicon-based structural films; C.L. Muhlstein, E.A. Stach and R.O. Ritchie, International Congress on Fatigue, Stockholm, Sweden, 2002. Keynote Lecture.
  49. Interaction between surface morphology and misfit dislocations during strain relaxation in semiconductor heteroepitaxy; R. Hull, J.L. Gray, C.-C. Wu, J. Floro, and E.A. Stach, Extended Defects in Semiconductors, Bologna, Italy, June 2002.
  50. Fatigue of thin-film silicon-based MEMS materials: experiments, mechanisms and durability; C. Muhlstein, E.A. Stach (presenting) and R.O. Ritchie, at "MEMS and Nanotechnology" Symposium, 14th U.S. National Congress of Theoretical and Applied Mechanics, Blacksburg, VA, June 2002.
  51. On the suppression of premature fatigue failure in thin-film polycrystalline silicon for MEMS; C. Muhlstein, E.A. Stach (presenting) and R.O. Ritchie, at "Mechanics of Thin Films and Other Small Structures" Symposium, Fourteenth U.S. National Congress of Theoretical and Applied Mechanics, Blacksburg, VA, June 2002.
  52. Thermochemical decomposition in GaN: Laser lift-off and novel defect formation; E.A. Stach, T. Sands, Y. Cho and W.S. Wong, "Defect and Impurity-Engineered Semiconductors and Devices, III", Materials Research Society Meeting, San Francisco, CA, April 2002.
  53. On the mechanism of high-cycle fatigue in Si thin films for MEMS devices; C. L. Muhlstein, E. A. Stach, R. O. Ritchie, "Deformation and Stresses in Small Structures", TMS Annual Meeting, Seattle, WA February 2002.
  54. Ultrananocrystalline diamond: synthesis, properties and applications, A.V. Sumant, O. Aucielllo, D.M. Gruen, J.A. Carlise, J. Birrell, N. Moldovan, D. Mancini, D. Ersoy, E.A. Stach, A. Erdemir, Surface Engineering: Science and Technology II: Advances in Coating Technologies, TMS Annual Meeting Seattle, WA, February 2002.
  55. In-situ TEM: a tool for quantitative observations of deformation behavior in thin films and and nanostructured materials; E.A. Stach, DOE Workshop on New Materials Science Enabled by In-situ Microscopies, Half Moon Bay, CA, January 2001.
  56. Fatigue failure of silicon-based micron-sized thin structural films; C. Muhlstein, E.A. Stach and R.O. Ritchie 10th International Congress of Fracture, Honolulu, HI, December 2001.
  57. In-situ transmission electron microscopy studies of dislocations in metallic thin films; E.A. Stach, A. M. Minor, J. W. Morris, Jr., J. A. Floro, S. Seel and C. V. Thompson, International Conference on Materials for Advanced Technologies - "Thin Films: Stress, Strain and Structure - Property Relationships" Symposium, IUMRS Meeting, Singapore, July 2001.
  58. Application of thermal, mechanical, electrical and optical stresses to thin film microstructures in-situ in the transmission electron microscope; R. Hull, D.T. Mathes, E.A. Stach and F.M. Ross, International Conference on Materials for Advanced Technologies - "Thin Films: Stress, Strain and Structure - Property Relationships" Symposium, IUMRS Meeting, Singapore, July 2001.
  59. Fatigue of silicon-based structural films; C. Muhlstein, E.A. Stach, R.O. Ritchie International Conference on Materials for Advanced Technologies, International Conference on Materials for Advanced Technologies - "Thin Films: Stress, Strain and Structure - Property Relationships" Symposium, IUMRS Meeting, Singapore, July 2001.
  60. In-situ transmission electron microscopy studies of dislocations in metallic thin films; E.A. Stach, A. Minor, J.W. Morris, Jr., J.A. Floro, S.C. Seel and C.V. Thompson "Dislocations and Deformation Mechanisms in Thin Films and Small Structures", Spring 2001 Materials Research Society meeting, San Francisco, CA, April 2001.
  61. Dislocation - defect interactions in semiconductor thin films; R. Hull, J.L. Gray, J.C. Bean, E.A. Stach, F.M. Ross, R.M. Tromp and K.S. Jones; Microscopy of Semiconducting Materials Conference, Oxford, England, March 2001.
  62. In-situ application of thermal, mechanical, electrical and optical stresses to semiconductor structures in the transmission electron microscope; R. Hull, T. Chraska, D. Mathes, E. Stach, F. Ross, and R. Tromp, US-Japan Workshop on In-Situ Electron Microscopy, Japan, November 2000.
  63. Dislocation dynamics in strained epitaxial films; R. Hull, J.C. Bean and E.A. Stach; Interfacial Dislocations: Symposium in Honor of J.H. van der Merwe on the 50th Anniversary of His Discovery, TMS meeting, St. Louis, October 2000.
  64. In-situ transmission electron microscopy studies of defect formation and dislocation interactions in semiconductor materials; E.A. Stach, R. Hull, R.M. Tromp, K. Schwarz, F.M. Ross, C.F Kisielowski, T. Sands and W.S. Wong, International Conference on Extended Defects in Semiconductors, Sussex, England, July 2000.
  65. In-situ microscopy in an aberration-free microscope; Summer Workshop on Aberration Correction in Electron Microscopy, Argonne National Laboratory, Argonne, IL, July 2000.
  66. In-situ transmission electron microscopy studies of dislocations in thin film systems; E.A. Stach, R. Hull, R.M. Tromp, F.M. Ross, K.W. Schwarz, M.C. Reuter, and W.D. Nix, Fall 1999 Materials Research Society Meeting, Boston, MA, December 1999.
  67. Quantitative experimental determination of the effect of dislocation - dislocation interactions on strain relaxation in lattice mismatched heterostructures; E. A. Stach, R. Hull, R. M. Tromp, F. M. Ross and M. C. Reuter, and J. C. Bean, informal "Dislocation Dynamics Day" symposium, Materials Research Society Meeting, Boston, MA, December 1998.
  68. New directions for electron and ion beam characterization of electronic materials and devices; R. Hull, J. C. Bean, J. Demarest, D. Dunn, Y. Quan and E.A. Stach, International Conference on Electron Microscopy, Cancun, Mexico, September 1998.
  69. Interaction of moving dislocations in semiconductors with point, line and planar defects; R. Hull, E. A. Stach, R. Tromp, F. Ross and M. Reuter, International Conference on Extended Defects in Semiconductors, Warsaw, Poland, September 1998.
  70. In-situ observation of thermal, mechanical, electrical and optical degradation modes in semiconductor materials and devices in the transmission electron microscope; R. Hull, E. A. Stach, J. C. Bean, D. Bahnck and F. M. Ross; Materials Research Society Conference, Boston, MA, November 1995,.
  71. The relationship between strain, defects and electronic device performance in lattice-mismatched heteroepitaxy; R. Hull, E. A. Stach, J. C. Bean, D. Bahnck, L.J. Peticolas, and F. M. Ross; Materials Research Society Conference, San Francisco, CA, April 1995.

Contributed Oral Conference Presentations:

  1. High-cycle fatigue of micron-scale silicon structural films for MEMS applications, D.H. Alsem, E.A. Stach and R.O. Ritchie, MicroNanoReliability 2007, Berlin, Germany, September, 2007.
  2. Using real time microscopy to quantitatively determine nucleation mechanisms and kinetics during the growth of Si nanowires on Si3N4 substrates; Bong-Joong Kim, E. A. Stach, S. Kodambaka, J. Tersoff, M.C. Reuter , K. Reuter, F.M. Ross, Symposium, TMS EMC, South Bend, IN, June, 2007.
  3. Using real time microscopy to quantitatively determine nucleation mechanisms and kinetics during the growth of Si nanowires on Si3N4 substrates; Bong-Joong Kim, E. A. Stach, S. Kodambaka, J. Tersoff, M.C. Reuter , K. Reuter, F.M. Ross, Applications of Nanotubes and Nanowires Symposium, Spring MRS meeting, San Francisco, April, 2007.
  4. Nanoscale wear mechanisms in polysilicon for MEMS applications; Daan Hein Alsem, Eric A. Stach, Michael T. Dugger and Robert O. Ritchie, Surface and Interfacial Nanomechanics Symposium, Spring 2007 MRS meeting, April 2007.
  5. Study of the organic residue influence on the crystal structure of Ge nanoparticles; Suk Jun Kim, Eric A. Stach, Carol A. Handwerker, Ling-Shao Chang and Alexander Wei, Pb-Free and RoHS-Compliant Materials and Processes for Microelectronics Symposium, Spring 2007 MRS meeting, April 2007.
  6. Thermal and TEM analysis of Sn nanoparticles for use in nanosolder applications; Kevin Anthony Grossklaus, Eric Stach and Carol Handwerker, Pb-Free and RoHS-Compliant Materials and Processes for Microelectronics Symposium, Spring 2007 MRS meeting, April 2007.
  7. Diameter controlled metallic nanowires on an alpha synuclein template; Sonal Shivaji Padalkar1,2, Robert Colby1,2, Parijat Deb1,2, Kara Cunzeman1, John Hulleman3, Jean-Christophe Rochet3, Eric Stach1,2 and Lia Stanciu, The Nature of Design--Utilizing Biology's Portfolio, Spring 2007 MRS meeting, April 2007.
  8. Deformation-induced grain agglomeration in nanocrystalline Ni, Scott Mao, Zhiwei Shan, Jrg Wiezorek, James Knapp, David Follstaedt, and Eric Stach, Structural Materials Division Symposium: Mechanical Behavior of Nanostructured Materials, in Honor of Carl Koch, TMS Annual Meeting & Exhibition, Orlando, February 2007.
  9. Reaction of NO and O2 to NO2 on supported and model Pt catalysts: Catalyst deactivation and kinetics as a function of particle size; S. Mulla, L. Cumaranatunge, Andrew Smeltz, S.M. Kim, J. Miller, D. Blom, L. Allard, E.A. Stach, W.N. Delgass, and F. Ribeiro, 20th North American Meeting of the Catalysis Society.
  10. Analysis of nano-scale stress in strained silicon materials and microelectronics devices by convergent beam electron diffraction; Peng Zhang, Andrei A. Istratov, Haifeng He, Chris Nelson, Joel Ager, Eric Stach, John Spence, Christian Kisielowski, and Eicke R. Weber, 209th Electrochemical Society Meeting, Spring 2006.
  11. In-situ nanoindentation of silicon, E.A. Stach, D. Ge, A.M. Minor, S. Asif, T. Wyrobek and O. Warren, "Deformation in Brittle Materials", Fall 2006 Materials Research Society Meeting.
  12. In-situ TEM observations of twin formation modes in L1o-ordered intermetallic MnAl; Cagatay Yanar, Eric A. Stach, Velemir Radmilovic, William A. Soffa and Jrg M.K Wiezorek, submitted to In-situ Electron Microscopy, Fall 2005 Materials Research Society Meeting,
  13. Observation of a hybrid displacive-diffusional ordering phase transformation mode in near equiatomic MnAl alloys during in-situ TEM heating studies; Jrg M.K. Wiezorek, Cagatay Yanar, Eric A. Stach, Velemir Radmilovic and William A. Soffa, submitted to "Solid-Solid Interfaces from Observation to Modeling", Fall 2005 Materials Research Society Meeting
  14. Grain agglomeration in nanocrystalline Ni; Z. Shan, D.M. Follstaedt, E.A. Stach, J. Knapp, J. Wiezorek and S.X. Mao, submitted to Mechanical Properties of Nanostructured Materials - Experiments and Modeling, Spring 2005 Materials Research Society Meeting, San Francisco, CA, April 2005.
  15. Behavior of individual grains in nanocrystalline Ni during deformation; Z. Shan, E.A. Stach, J. Knapp, D.M. Follstaedt, J. Wiezorek and S.X. Mao, Thin Films and Mechanical Properties XI, Spring 2005 Materials Research Society Meeting, San Francisco, CA, April 2005.
  16. Deformation mechanisms during nanoindentation of ultrafine and nanocrystalline metals; Miao Jin, Andrew M. Minor, Daibin Ge, Eric A. Stach, and J.W. Morris, Jr., Thin Films and Mechanical Properties XI, Spring 2005 Materials Research Society Meeting, San Francisco, CA, April 2005.
  17. Advances in electron energy loss spectroscopy obtained from monochromated and aberration-corrected scanning transmission electron microscopes; N.D. Browning, I. Arslan, A.L. Bleloch, R. Erni, J. Idrobo, and E.A. Stach, "Imaging Atomic-scale Mechanics, Chemistry and Structure with Electron Microscopy", Fall 2004 Materials Research Society Meeting.
  18. Microstructure of phase-transformed tantalum thin films; K. Jackson, R. Knepper, E.A. Stach and S.P. Baker, "Imaging Atomic-scale Mechanics, Chemistry and Structure with Electron Microscopy", Fall 2004 Materials Research Society Meeting.
  19. TEM studies of plasticity mechanisms in nanocrystalline Ni during tensile deformation; Z. Shan, J.M.K. Wiezorek, J. Knapp, D.M. Follstaedt, E.A. Stach and S.X. Mao, "Imaging Atomic-scale Mechanics, Chemistry and Structure with Electron Microscopy", Fall 2004 Materials Research Society Meeting.
  20. In-situ electron microscopy studies of the effect of solute segregation on grain boundary anisotropy and mobility in aluminum alloys, M.L. Taheri, A. Rollet, E.A. Stach and H. Weiland, "Imaging Atomic-scale Mechanics, Chemistry and Structure with Electron Microscopy", Fall 2004 Materials Research Society Meeting.
  21. In-situ TEM studies of deformation mechanisms during nanoindentation of ultrafine and nanocrystalline metals; M. Jin, A. Minor, E.A. Stach and J.W. Morris, Jr., "Fundamentals of Nanoindentation and Nanotribology III," Fall 2004 Materials Research Society Meeting.
  22. Direct evidence of a deformation mechanism crossover in nanocrystalline nickel; Z. Shan, J.M.K. Wiezorek, S. Mao, D. Follstaedt, J. Knapp and E.A. Stach, "Size Effects in Plasticity", Fall 2004 Materials Research Society Meeting.
  23. Mechanical Properties and deformation of fine grained Ni by dislocation and grain boundary processes; D.M. Follstaedt, J.A. Knapp, S.X. Mao, J.M.K. Wiezorek, R.C. Hugo, and E.A. Stach, "Size Effects in Plasticity", Fall 2004 Materials Research Society Meeting.
  24. Observing the impact of charge transport in metal nanowires by in-situ transmission electron microscopy; V. Gopal, E.A. Stach and P. Yang, "Nanoparticles and Nanowire Building Blocks - Synthesis, Processing, Characterization and Theory", Spring 2004 Materials Research Society Meeting, San Francisco, April 2004.
  25. Utilizing on-chip testing and electron microscopy to obtain a mechanistic understanding of fatigue and wear in polysilicon structural films; Daan Hein Alsem, Eric A. Stach, Christopher L. Muhlstein, Michael T. Dugger and Robert O. Ritchie, "Nanoscale Materials and Modeling - Relations Among Processing, Microstructure, and Mechanical Properties", Spring 2004 Materials Research Society Meeting, San Francisco, April 2004.
  26. The deformation behavior of Fe-C martensitic steel observed by in-situ nanoindentation in a TEM; Takahito Ohmura, Andrew M Minor, Eric A Stach and John W Morris, "Nanoscale Materials and Modeling - Relations Among Processing, Microstructure, and Mechanical Properties", Spring 2004 Materials Research Society Meeting, San Francisco, April 2004.
  27. Direct experimental visualization of grain rotation induced grain reorientation in PLD nanocrystalline Ni; Zhiwei Shan, James Knapp, D. M. Follstaedt, E. A. Stach, J.M.K. Wiezorek and Scott Mao, "Nanoscale Materials and Modeling - Relations Among Processing, Microstructure, and Mechanical Properties", Spring 2004 Materials Research Society Meeting, San Francisco, April 2004.
  28. Combining micromechanical testing and electron microscopy to obtain a mechanistic understanding of fatigue and wear in microelectromechanical systems; D.H. Alsem, E.A. Stach, C.L. Muhlstein, M.T. Dugger, and R.O. Ritchie, "Deformation and Stresses in Small Volumes", 2004 TMS Annual Meeting, Charlotte, N.C., March, 2004.
  29. A direct-write lithography technique for the fabrication of nano-circuit interconnects; V. Gopal E.A. Stach, R. Fan and P. Yang, "Non-traditional Approaches to Patterning", Fall 2003 Materials Research Society Meeting, December 2003, Boston, MA.
  30. Deposition of metallic nanowires by electron- and ion-beam assisted decomposition; V. Gopal, E.A. Stach, and V. R. Radmilovic, "Radiation Effects and Ion Beam Processing of Materials", Fall 2003 Materials Research Society Meeting, December 2003, Boston, MA.
  31. Direct observations of grain boundary phenomena during indentation of Al and Al-Mg thin films; W.A. Soer, J.Th.M. De Hosson, A.M. Minor, M. Jin, E. A. Stach, E.T. Lilleodden and J. W. Morris, Jr., "Thin Films - Stresses and Mechanical Properties X", Fall 2003 Materials Research Society Meeting, December 2003, Boston, MA.
  32. Direct observations of the transmission of strain between grains in ultrafine-grained material; A.M. Minor, E.T. Lilleoddent, E.A. Stach and J.W. Morris, Jr.; Mechanical Properties of Nanostructured Materials and Nanocomposites", Fall 2003 Materials Research Society Meeting, December 2003, Boston, MA.
  33. FIB-TEM characterization of surface and sub-surface defects introduced into lithium niobate by a femtosecond laser; E.A. Stach, V.R. Radmilovic, D. Deshpande, A. Malshe, D. Alexander, D. Doerr, Microscopy and Microanalysis Meeting, San Antonio, TX, August 2003.
  34. Revealing deformation mechanisms through in-situ nanoindentation of thin films in an electron microscope, A. Minor, E.A. Stach, E.T. Lilleodden, M. Jin, W. Soer, J.Th. de Hossen and J.W. Morris, Jr., International Conference on the Strength of Metals and Alloys, Budapest, Hungary, August 2003.
  35. Formation and characterization of nanopores; S.-J. Park, V. R. Radmilovic, E. A. Stach, A. Persaud, J. Nilsson, and T. Schenkel; AVS Nanoscience and Bionanoscience Research Meeting, Berkeley, CA, June 2003.
  36. High cycle fatigue mechanisms in polycrystalline silicon structural films at room temperature; C. L. Muhlstein, E.A. Stach and R.O. Ritchie 9th International Conference on The Mechanical Behaviour of Materials, Geneva, Switzerland , May 2003.
  37. Controllable formation of a few nanometer wide holes in membranes with a dual beam FIB; T. Schenkel, E. A. Stach, V. Radmilovic, S.-J. Park, and A. Persaud; 47th International Conference on Electron, Ion and Photon Beam Technology & Nanofabrication, Tampa, FL, May 2003.
  38. Measuring and observing the indentation behavior of silicon through in situ nanoindentation in a TEM; A.M. Minor, E.T. Lilleodden, E.A. Stach, M. Jin, and J.W.Morris, Jr. "Mechanical Properties Derived from Nanostructuring Materials", Spring 2003 Materials Research Society Meeting, San Francisco, CA, April 2003.
  39. In-situ studies of deformation by nanoindentation; A. Minor, E.T. Lilleodden, E.A. Stach and J.W. Morris, Jr., TMS Annual Meeting, San Diego, CA, March 2003.
  40. In-situ nanoindentation of ultrananocrystalline diamond and amorphous diamond thin film coatings; A.M. Minor, E.A. Stach, J.W. Morris Jr., T.A. Friedmann, J.A. Carlisle, Fall MRS Meeting, Boston, December 2002.
  41. Environmental and interfacial effects on the premature failure of polycrystalline silicon structural films; C.L. Muhlstein, E.A. Stach and R.O. Ritchie, Fall MRS Meeting, Boston, MA December 2002.
  42. Quantitative determination of the kinetics of nanopipe growth in GaN E.A. Stach, W.S. Wong and M. Kneissl, Fall MRS Meeting, Boston, December 2002.
  43. On the origin of orientation ratio in sputtered longitudinal media; B.G. Demcyck, E.C. Nelson and E.A. Stach, Conference on Magnetism and Magnetic Materials, Tampa, Florida, November 2002.
  44. A method for analyzing nanomechanical properties of cutting tools for nanomanufacturing; K. Virwani, D. K. Sood, W. F. Schmidt, A. P. Malshe, E. A. Stach and A. M. Minor, ASME-JSME Joint Meeting, Honolulu, HI, October 2002.
  45. Mechanism of laser lift-off in GaN; E.A. Stach, J. Schroeder, Y. Cho, T. Sands, and W.S. Wong, 4th Symposium on Non-Stoichiometric III-V Compounds, Asilomar, CA, October 2002.
  46. Fatigue and fracture of polysilicon microelectromechanical systems; R.O. Ritchie, C.L. Muhlstein and E.A. Stach, "Mechanisms and Mechanics of Fracture" TMS Fall Meeting, Columbus, OH, October 2002.
  47. Diffusional and displacive modes of transformation in the formation of the tau-phase in ferromagnetic manganese-aluminum alloys; W.A. Soffa, C. Yanar, V.R. Radmilovic, E.A. Stach and J.M.K. Wiezorek, "Chemistry and Physics of Materials", TMS Fall Meeting, Columbus, OH, October 2002.
  48. Mechanisms of twinning in the ferromagnetic phase in manganese-aluminum alloys; W. A. Soffa, C. Yanar, E.A. Stach, V.R. Radmilovic and J.M.K. Wiezorek, TMS Fall Meeting Columbus, OH, October 2002.
  49. Diffusional and displacive modes of transformation in the formation of the tau-phase in ferromagnetic manganese-aluminum alloys; W. A. Soffa, C. Yanar, V.R. Radmilovic, E.A. Stach and J.M.K. Wiezorek, TMS Fall Meeting, Columbus, OH, October 2002.
  50. In-situ nanoindentation: a novel method for exploring thin film mechanical behavior; E.A. Stach, A.M. Minor, E.T. Lilleodden and J.W. Morris, Jr., at "Mechanics of Thin Films and Other Small Structures" symposium, Fourteenth U.S. National Congress of Theoretical and Applied Mechanics, Blacksburg, VA, June 2002.
  51. Surface engineering of polysilicon MEMS for fatigue resistance; C.L. Muhlstein, W.R. Ashurst, E.A. Stach, and R.O. Ritchie, "MEMS and Bio-MEMS", Spring 2002 Materials Research Society Meeting, San Francisco, CA April 2002.
  52. Quantitative in situ nanoindentation of metallic thin films; A.M. Minor, E.A. Stach and J.W. Morris, Jr., "Deformation and stresses in small structures", TMS Annual Meeting, Seattle, WA. February 2002.
  53. In-situ nanoindentation of thin films in a transmission electron microscope; A.M. Minor, E.A. Stach and J.W. Morris, Jr., "Surface Engineering: Science and Technology II: Characterization / Modeling", TMS Annual Meeting, Seattle, WA February 2002.
  54. Heteroepitaxial aluminum thin films on silicon: a model system for understanding thin film plasticity; E. A Stach, U. Dahmen, D. Nowak, O. Thomas and S.P. Baker, "Deformation and stresses in small structures", 2002 TMS Annual Meeting, Seattle, WA February 2002.
  55. In-situ annealing observations during    phase transformation in MnAl-based ferromagnetic alloys; C. Yanar, J.K.W. Wiezorek, W.A. Soffa and E.A. Stach; "Phase Stability, Phase Transformations and Reactive Phase Formation in Electronic Materials", 2002 TMS Annual Meeting, Seattle, WA February 2002.
  56. In-situ TEM study of grain coarsening under electrical current application in silver thin films; X.Y. Phung, J.R. Groza and E.A. Stach, "Materials Processing: Fundamentals", 2002 TMS Annual Meeting, Seattle, WA February 2002.
  57. Role of microstructure in fracture and fatigue processes in micron-scale silicon structural films; C.L. Muhlstein, E.A. Stach (presenting), W.G. Stratton, S.B. Brown and R.O. Ritchie, "Materials Science of Microelectromechanical Systems (MEMS) Devices IV", Fall 2001 Materials Research Society Meeting, Boston, MA, November, 2001.
  58. X-ray diffraction analysis of strain induced during thermal cycling of a thin aluminum bi-crystal film; D. E. Nowak, S. P. Baker, K. Finkelstein and E. A. Stach "Thin Films - Stresses and Mechanical Properties IX", Fall 2001 Materials Research Society Meeting, Boston, MA, November, 2001.
  59. Quantitative in situ nanoindentation of metallic thin films; A.M. Minor, E.A. Stach and J.W. Morris, Jr., "Thin Films - Stresses and Mechanical Properties IX", Fall 2001 Materials Research Society Meeting, Boston, MA, November 2001.
  60. Observations of thin film AlN growth on sapphire and III-nitride substrates by MBE; M. Yeadon, K. P. Loh and E. A. Stach, "Current Issues in Heteroepitaxial Growth, Stress Relaxation and Self Assembly", Fall 2001 Materials Research Society Meeting, Boston, MA, November, 2001.
  61. Mechanisms of GaN separation from sapphire by laser lift-off; Y. Cho, A. Salleo, T. Sands, N.W. Cheung, G. Solomon, E. A. Stach, W.S. Wong and M. Kneissl, "GaN and Related Alloys", Fall 2001 Materials Research Society Meeting, Boston, MA, November, 2001.
  62. High cycle fatigue of silicon based MEMS; C. Muhlstein, E.A. Stach, R.O. Ritchie, "Fatigue of Advanced Materials" Symposium, MMC 2001 Conference, San Diego, California, June 2001.
  63. Microstructural Comparison of Ag Films Grown on Amorphous TiO2 and Polycrystalline ZnO; R. Dannenberg, E.A. Stach, and D. Glenn, "Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures", Spring 2001 Materials Research Society meeting, San Francisco, CA, April 2001.
  64. Studies of mechanical properties of ultrananocrystalline diamond (UNCD) thin films using nanoindentation; A.V. Sumant, O. Auciello, D.M. Gruen, J. Birrell , J.A. Carlise, H.D. Espinosa, B.C. Prorok and E.A. Stach, "Nanotubes, Fullerenes, Nanostructured and Disordered Carbon", Spring 2001 Materials Research Society meeting, San Francisco, CA, April 2001
  65. Quantitative determination of the effect of elastic anisotropy on grain-boundary dislocation nucleation and dislocation glide in Al (011) thin films on Si (100); E.A. Stach, U. Dahmen and W.D. Nix, "The Limits of Strength in Theory and Practice" symposium, Fall 2000 Materials Research Society meeting, Boston MA, December, 2000.
  66. Development of a nanoindenter for transmission electron microscopy; E.A. Stach, D.K. Owen, T.T. Freeman, M.A. Wall, A. M. Minor, T. Chraska and R. Hull, "Nanoindentation and Nanotribology II" symposium, Fall 2000 Materials Research Society meeting, Boston MA, December, 2000.
  67. In-situ nanoindentation of transition metal carbonitrides in the transmission electron microscope; A.M. Minor, E.A. Stach, C.R. Krenn and J.W. Morris, Jr., "The Limits of Strength in Theory and Practice", Fall 2000 Materials Research Society meeting, Boston MA, December, 2000.
  68. Development of induced crystallization as a pattern transfer mechanism for nonlithographic nanofabrication; M.J. Cabral, T. Chraska, S. Mesarovic, D.M. Longo, E.A. Stach, J.C. Bean, and R. Hull, "Nonlithographic and Lithographic Methods for Nanofabrication-From Ultralarge-Scale Integration to Photonics to Molecular Electronics", Fall 2000 Materials Research Society meeting, Boston MA, December, 2000.
  69. Development of a nanoindenter for in-situ transmission electron microscopy; E.A. Stach, D.K. Owen, T.T. Freeman, M.A. Wall, A. M. Minor, T. Chraska and R. Hull, "EM at the Frontier" symposium, Naval Research Laboratory, Stennis Space Center. November, 2000.
  70. The effect of elastic anisotropy on dislocation-mediated plasticity in the epitaxial Al (110) / Si (001) thin film system; E.A. Stach, U. Dahmen and W.D. Nix, oral presentation at the Twelfth International Conference on the Strength of Materials, Alisomar, CA, August, 2000.
  71. Real time observations of dislocation-mediated plasticity in the epitaxial aluminum (110) / silicon (001) thin film system; E.A. Stach, U. Dahmen, and W.D. Nix, oral presentation at Microscopy and Microanalysis 2000, Philadelphia, PA, August 2000.
  72. A tilting procedure to enhance compositional contrast and reduce residual Bragg contrast in EFTEM imaging of planar interfaces; K.T. Moore, E.A. Stach, J.M. Howe, D.C. Elbert, D.R. Veblen, oral presentation at Microscopy and Microanalysis 2000, Philadelphia, PA, August 2000.
  73. Real time observations of the formation of nanopipes in GaN; E.A. Stach and C.F. Kisielowski, W.S. Wong, T. Sands and N.W. Cheung, oral presentation at the TMS Electronic Materials Conference, Denver, CO, June 2000.
  74. Real time observation and characterization of dislocation motion, nanopipe formation and nitrogen desorption in GaN; E.A. Stach and C.F. Kisielowski, W.S. Wong, T. Sands and N.W. Cheung, oral presentation at the Spring 2000 Materials Research Society Meeting, San Francisco, CA, April 2000.
  75. Real time observation and quantification of dislocation mediated plasticity in bicrystal Al (011) on Si (001); E.A. Stach, U. Dahmen, and W.D. Nix, Spring 2000 Materials Research Society Meeting, San Francisco, CA, April 2000.
  76. In-situ heating stage transmission electron microscopy for temperable optical coating development; R. Dannenberg and E.A Stach, Society for Vacuum Coatings, Denver, CO, April 2000.
  77. In-situ TEM studies of abnormal grain growth in nano-crystalline Ag; R. Dannenberg, E.A. Stach, J.R. Groza and B.J. Dresser, TMS Annual Meeting, Nashville, TN, March 2000.
  78. In-situ annealing transmission electron microscopy study of Pd/Ge/Pd/GaAs interfacial reactions; F. Radulescu, J.M. McCarthy and E.A. Stach, Fall 1999 Materials Research Society Meeting, Boston, MA, December 1999.
  79. Real time observation of grain growth in sputtered Ag and TiOx thin films; R. Dannenberg, E.A. Stach (presenting), J.R. Groza and B.J. Dresser, Fall 1999 Materials Research Society Meeting, Boston, MA, December 1999.
  80. Microstructure-dielectric property relations in (Ba,Sr)TiO3 films grown by combinatorial synthesis techniques; I. Takeuchi, H. Chang, X.-D. Xiang and E. A. Stach, Fall 1999 Materials Research Society Meeting, Boston, MA, December 1999.
  81. Microstructure-dielectric property relations in (Ba,Sr)TiO3 films grown by combinatorial synthesis techniques; I. Takeuchi, H. Chang, X.-D. Xiang and E. A. Stach, 6th International Workshop on Oxide Electronics, College Park, MD, December 1999.
  82. In-situ study of grain coarsening in nanocrystalline metals; R. Dannenberg, E.A. Stach, B. Dresser, and Joanna R. Groza, Sintering '99 Conference, State College, PA, November 1999.
  83. The role of dislocation interactions in heteroepitaxial strain relaxation; E.A. Stach, R. Hull, R.M. Tromp, F.M. Ross, M.C. Reuter and J.C. Bean, Microscopy and Microanalysis, Portland, OR, August, 1999.
  84. The role of dislocation interactions in heteroepitaxial strain relaxation; E.A. Stach, R. Hull, R.M. Tromp, F.M. Ross, M.C. Reuter and J.C. Bean, International Conference on Defects in Semiconductors, Berkeley, CA, July, 1999.
  85. Quantitative experimental determination of the effect of dislocation - dislocation interactions on strain relaxation in lattice mismatched heterostructures; E. A. Stach, R. Hull, R. M. Tromp, F. M. Ross and M. C. Reuter, and J. C. Bean; Fall 1998 Materials Research Society Meeting, Boston, MA, December 1998.
  86. Development of a process simulator for strained layer epitaxy; R. Hull, E.A. Stach, Q. Yuan and J. C. Bean, Fall 1998 Materials Research Society Meeting, Boston, MA, December 1998.
  87. Interaction of misfit dislocations with ion-implanted species in Si / SiGe / Si (001) heterostructures; E. A. Stach, R. Hull, J. C. Bean, K.S. Jones and A. Nejim; Electronic Materials Conference, Charlottesville, VA June, 1998.
  88. In-situ studies of the interaction of dislocations with point defects during annealing of ion implanted Si / SiGe / Si (001) heterostructures; E. A. Stach, R. Hull, J. C. Bean, K. S. Jones and A. Nejim; American Physical Society conference, Los Angeles, CA, March 1998.
  89. In-situ studies of the interaction of dislocations with point defects during annealing of ion implanted Si / SiGe / Si (001) heterostructures; E.A. Stach, R. Hull, J. C. Bean, K. S. Jones, and A. Nejim; ASU Winter Workshop on in-situ Electron Microscopy, Scottsdale, AZ, January 1998.
  90. Measurement of misfit dislocat
  91. ion velocities during the UHV-CVD growth of SiGe/ Si (100); E. A. Stach, R. Hull, R. M. Tromp, M. C. Reuter, F. K. LeGoues, M. Copel, and J. C. Bean; Materials Research Society Conference, San Francisco, CA, April 1997.
  92. Effect of processing on the kinetics of misfit strain relaxation in (Si) / SiGe/ Si heterostructures; E. A. Stach, R. Hull, A. Nejim, R. M. Tromp, M. C. Reuter, J. C. Bean and A. Walz-Flannigan; Materials Research Society Conference, Boston, MA, December, 1996.
  93. Suppression of boron outdiffusion in SiGe HBTs by carbon incorporation; L. D. Lanzerotti, J. C. Sturm, E. A. Stach, R. Hull, T. Buyuklimanli and C. Magee; Materials Research Society Conference, San Francisco, CA, April, 1997.
  94. Suppression of boron outdiffusion in SiGe HBTs by carbon incorporation; L. D. Lanzerotti, J. C. Sturm, E. A. Stach, R. Hull, T. Buyuklimanli and C. Magee; IEDM Electron Devices Conference 1996, 249-252, December, 1996.
  95. Relaxation of coefficient of thermal expansion misfit strains in a metal coating - ceramic substrate functionally graded system by dislocation punching; M. Taya, E. A. Stach and T. Mori; 12th US National Congress of Applied Mechanics, June 1994, Seattle, WA.

Poster Presentations

  1. Understanding the growth mechanism of single-walled carbon nanotubes using the "Spin-on-Catalyst" Method; Seung Min Kim, Mark Pender, Tyson C. Back, Allison Jacques, Benji Maruyama, and Eric A. Stach, Spring 2007 MRS Meeting.
  2. In-situ nanoindentation of ultrananocrystalline diamond and amorphous diamond thin film coatings, E.A. Stach, A.M. Minor, D. Ge, J.W. Morris, Jr., T.A. Friedmann, X. Xiao, O. Auciello and J.A. Carlisle, Applied Diamond Conference - Nanocarbon 2005, Argonne National Laboratory, May 15-19, 2005.
  3. Atomic and electronic structure of mixed and partial dislocations in GaN; I. Arslan, A.J. Bleloch, E.A. Stach and N.D. Browning, "GaN, AlN, InN and Their Alloys", Fall 2004 Materials Research Society Meeting, Boston Ma, November, 2004.
  4. Octahedral twins in L1o-ordered manganese-aluminum intermetallics; J.M.K. Wiezorek, W.A. Soffa, C. Yanar, E.A. Stach and V.R. Radmilovic, Integrative and Interdisciplinary Aspects of Intermetallics, Fall 2004 Materials Research Society Meeting.
  5. Influence of deposition rate on the crystallization kinetics and surface microstructure of amorphous Nb2O5 thin films, R. Dannenberg and E.A. Stach, " Nanoscale Materials and Modeling - Relations Among Processing, Microstructure, and Mechanical Properties", Spring 2004 Materials Research Society Meeting, San Francisco, April 2004.
  6. A comparison of focused ion beam and electron beam induced deposition of conductive platinum nanowires; V. Gopal, E.A. Stach, and V.R. Radmilovic, Frontiers of Electron Microscopy in Materials Science, Berkeley, CA, October 2003.
  7. In-situ TEM studies of nanoindentation: a novel method for quantitatively exploring thin film mechanical behavior; A.M. Minor, E.A. Stach, E.T. Lilleodden, M. Jin, and J.W. Morris, Jr., Frontiers of Electron Microscopy in Materials Science, Berkeley, CA, October 2003.
  8. Quantitative in-situ nanoindentation of materials in a transmission electron microscope; A.M. Minor, E.A. Stach, E.T. Lilleodden, M. Jin, and J.W. Morris, Jr., DOE Nanoscale Science Research Centers Workshop, Washington, DC, February 2003.
  9. Quantitative characterization of morphological evolution in Q = 2 Potts model aluminum thin films; D.H. Alsem, E.A. Stach and J. Th. M. De Hossen, Materials Research Society Meeting, Boston, MA, December 2002.
  10. Quantitative real time correlation between grain growth and texture evolution in Ag thin films; K. Hukari, E.A. Stach, A.M. Minor, R. Dannenberg, P. Sieck, Materials Research Society Meeting, Boston, MA, December 2002.
  11. The formation of twins and defect structures in the ferromagnetic L1O-ordered manganese-aluminides; J.M.K. Wiezorek, W.A. Soffa, C. Yanar, V.R. Radmilovic, E. A. Stach, Materials Research Society Meeting, Boston, MA, December 2002.
  12. Characterization of nanoparticle films and structures using focused ion beam milling and transmission electron microscopy, C.R. Perrey, C.B. Carter, P.G. Kotula, J.R. Michael, and E.A. Stach, Microscopy and Microanalysis 2002, Quebec City, Canada, August 2002.
  13. In situ nanoindentation of ultra-hard thin films in a TEM; A.M. Minor, E.A. Stach, E.T. Lilleodden, J.W. Morris, Jr., T.A. Friedmann and I. Petrov, Gordon Research Conference on Thin Film Mechanical Behavior, Colby College, Maine, July 2002.
  14. In situ nanoindentation of aluminum thin films in the TEM; E.T. Lilleodden, A.M. Minor, E.A. Stach, M. Jin, and J.W. Morris, Jr., Gordon Research Conference on Thin Film Mechanical Behavior, Colby College, Maine, July 2002.
  15. Quantitative in-situ nanoindentation of thin films in a transmission electron microscope; A.M. Minor, E.A. Stach and J.W. Morris, Jr., Microscopy and Microanalysis 2001, Long Beach, CA, August 2001.
  16. The National Center for Electron Microscopy: A user facility for materials characterization at ultra-high resolution; C. Kisielowski, E.A. Stach, H. Poppa and U. Dahmen, "Materials Problem Solving with the Electron Microscope", Spring 2001 Materials Research Society meeting, San Francisco, CA, April 2001.
  17. Crystallization kinetics of amorphous TiOxNy; K. Hukari, R. Dannenberg, and E.A. Stach, "Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures", Spring 2001 Materials Research Society meeting, San Francisco, CA, April 2001.
  18. Fabrication of MEMS components based on ultrananocrystalline diamond thin films and characterization of their mechanical properties; V. Sumant, O. Auciello, A.R. Krauss, D.M. Gruen, D. Ersoy, J. Tucek, A. Jayatissa, E.A. Stach, N. Moldovan, D. Mancini, H.G. Busmann and E.M. Meyer, "Materials Science of Microelectromechanical System (MEMS) Devices II", Fall 2000 Materials Research Society meeting, Boston MA, December 2000.
  19. Real time observation of dislocation motion, nanopipe formation and nitrogen desorption in GaN; E.A. Stach and C.F. Kisielowski, W.S. Wong, T. Sands and N.W. Cheung, Microscopy and Microanalysis Meeting, Philadelphia, PA, August 2000. Winner - Best Poster (Physical Sciences).
  20. Characterization of twin defects formed during GaAs(111)B MBE growth; Y. Park, M. Cich, R. Zhao, P. Specht, E.R. Weber, E.A. Stach, and S. Nozaki, North American Molecular Beam Epitaxy conference, Banff, Canada, October 1999.
  21. Structural characterization of laser-liftoff GaN; E.A. Stach, M. Kelsch, E.C. Nelson, W.S. Wong, N.W. Chung and T. Sands, Spring 2000 Materials Research Society Meeting, San Francisco, CA, April 2000.
  22. Measurement of misfit dislocation velocities during the UHV-CVD growth of SiGe/ Si (100); E. A. Stach, R. Hull, R. M. Tromp, M. C. Reuter, F. K. LeGoues, M. Copel, and J. C. Bean; International Semiconductor Device Research Symposium, Charlottesville VA, December 1997.
  23. Measurement of misfit dislocation velocities during the UHV-CVD growth of SiGe/ Si (100); E. A. Stach, R. Hull, R. M. Tromp, M. C. Reuter, F. K. LeGoues, M. Copel, and J. C. Bean; Gordon Conference on Thin Film and Crystal Growth Mechanisms, Plymouth State College, NH, July 1997.
  24. A study of low-temperature grown GaP by gas-source molecular beam epitaxy; W. G. Bi, X. B. Mei, K. L. Kavanagh, C. W. Tu, E. A. Stach and R. Hull; Materials Research Society Conference, San Francisco, CA, April, 1995.

Departmental Seminars

At Materials Science Departments unless otherwise noted

  • 1998: National Center for Electron Microscopy, Lawrence Berkeley National Laboratory
  • 1999: Sandia National Laboratories, Livermore
  • 2000: Xerox Palo Alto Research Center; Lucent Bell Laboratories; University of California at Berkeley
  • 2001: Sandia National Laboratories, Albuquerque; Northern California Society for Microscopy; University of Illinois at Urbana-Champaign; University of Virginia; Cornell University
  • 2002: IBM Almaden Research Laboratory; Palo Alto Research Center, Incorporated; The Advanced Light Source, Lawrence Berkeley National Laboratory; University of Washington; Stanford University; University of Colorado at Boulder; Brown University
  • 2003: University of California, Los Angeles; Department of Mechanical Engineering, University of Nevada, Reno; Department of Mechanical Engineering, University of Arkansas; Department of Physics, University of California, Berkeley; IBM Almaden Research Laboratory; Sandia National Laboratories, Albuquerque; Hysitron Corporation; Zyvex Corporation
  • 2004: Argonne National Laboratory; Purdue University; University of Florida; University of Maryland, University of California at Berkeley; Sandia National Laboratories, Albuquerque; Department of Mechanical Engineering, Princeton University; Palo Alto Research Center, Incorporated
  • 2005: Case Western Reserve University; Tohoku University; Argonne National Laboratory; Ohio State University; Department of Chemical Engineering, University of Louisville; University of Michigan; GE Global Research
  • 2006: Harvard University
  • 2007: University of Virginia
  • 2008: Department of Mechanical Engineering, University of Pittsburgh; Department of Mechanical Engineering, Michigan Technological University; Center for Nano and Molecular Science and Technology, University of Texas, Austin; Northwestern University