IMPACT & PRIME Labs
IMPACT (The Interaction of Materials with Particles and Components Testing experimental facility) and PRIME (Particle Radiation Interaction with Matter Experiments) facilities have been designed to study in-situ dynamic heterogeneous surfaces at the nano-scale exposed to varied environments that modify surface and interface properties. These facilities are used to investigate to investigate radiation-induced modification of materials and surfaces with applications to fusion science, nanotechnology and detector development.The philosophy behind experiments in IMPACT/PRIME relies heavily on its ability to provide a wide array of characterization techniques and conditions that properly simulate complex environments. The IMPACT/PRIME experiment achieves this by atomic-scale characterization of the evolution of elemental, chemical, and thermodynamic states of ultra-thin film surface and interfaces using complementary surface-sensitive characterization techniques.
In-situ techniques used in the IMPACT:
- Dynamic X-ray Photoelectron Spectroscopy (XPS)
- Dynamic Auger Electron Spectroscopy (AES)
- EUV(13.5-nm) Photoelectron Spectroscopy (EUPS)
- Ultraviolet Photoelectron Spectroscopy (UPS)
- EUV reflectometry (EUVR)
- Low-Energy Ion Scattering Spectroscopy (LEISS)
- Direct Recoil Spectroscopy
- Mass Spectrometry
- Secondary Electron Spectroscopy (SES)
- QCM
In-situ techniques used in PRIME
- Angle-resolved XPS
- Ultraviolet Photoelectron Spectroscopy (UPS)
- Low-Energy Ion Scattering Spectroscopy (LEISS)
- Direct Recoil Spectroscopy
- Mass Spectrometry
- QCM
Major components of IMPACT facility
- Ultrahigh vacuum chambers
- Inert gas ion sources
- Metal ion source
- E-beam evaporator
- Dual anode X-ray source (Specs GmbH, Model XR50)
- EUV source (13.5 nm, Phoenix Model sem20)
- Electron gun
- Faraday cups
- Hemispherical Electrostatic Analyzers (Specs, Omicron)
- Quartz crystal microbalances
- Residual gas analyzers
- EUV Photodiodes
- Effusion cell
- Innova SPM
Major components of PRIME facility
- Ultrahigh vacuum chambers
- Low energy broad beam ion sources
- Thermal evaporator
- Dual anode X-ray source
- Hemispherical Electrostatic Analyzers (VG Scienta)
- Quartz crystal microbalances
- Residual gas analyzers
- Veeco AFM
For further details of IMPACT and PRIME systems please contact: jtripat@purdue.edu or hassanein@purdue.edu
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