Service

JOURNAL EDITORIAL BOARDS:

  • Associate Editor, IEEE Design and Test (IEEE D&T), 2016-present
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    CONFERENCES:

    PANELIST:

    • "AI, Cognitive Information Processing, and Rebooting Computing" in IEEE International Conference on Rebooting Computing (ICRC 2017)
      • Co-Panelists: Stan Williams, HPE, Tom Conte, Georgia Tech, Trung Tran, Booz-Allen. Organizer: David Mountain, DoD
    • "Security Threats in the Analog / RF Domain: An Academic Perspective" in TxACE Workshop on Secure and Trusted Analog/RF Systems (TxACE STARS 2018)
      • Co-Panelists: Ioannis Savidis, Drexel University, Kaiyuan Yang, Rice University. Moderator: Swaroop Ghosh, Pennsylvania State University

    ORGANIZATION:

    • Special Session Organizer, IEEE Custom Integrated Circuits Conference (CICC 2018), “Forum: The Vanishing Boundary Between Digital and Analog”
    • Publicity Chair, 22nd IEEE European Test Symposium (ETS 2017)
    • Special Session Organizer, ACM/IEEE Design Automation Conference (DAC 2016), “Enabling the Internet of Things: Context-Awareness in Sensing, Communication and Computing”
    • Special Session Organizer, IEEE European Test Symposium 2017 (ETS), “Design and Test Needs for Adaptive, Self-Learning and Cognitive Systems”
    • Panel Organizer, in IEEE International Test Conference 2014 (ITC), “Elevator talks on emerging test frontiers”
    • Special Session Organizer, IEEE Sensors 2016, “Context-aware, ultra-low power, energy harvested IoT sensor nodes”
    • Special Session Organizer, IEEE International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) 2016

    EXECUTIVE COMMITTEE MEMBER:

    • IEEE European Test Symposium (ETS 2017)

    TECHNICAL PROGRAM COMMITTEE

    • IEEE Custom Integrated Circuits Conference (CICC 2019)
    • ACM/IEEE Design Automation Conference (DAC 2018)
    • IEEE International Conference on Design, Automation and Test in Europe (DATE 2017, 2018)
    • IEEE International Conference on Computer Aided Design (ICCAD 2017, 2018)
    • IEEE European Test Symposium (ETS 2017, 2018)
    • IEEE International Conference on VLSI Design (VLSID 2013, 2014, 2015, 2017, 2018)
    • IEEE International Test Conference (ITC 2014)
    • IEEE International Mixed-Signals Test Workshop (IMSTW 2017)
    • IEEE International Symposium on VLSI Design and Test 2014
    • IEEE International Workshop on Test and Validation of High Speed Analog Circuits (TVHAC 2013) held in conjunction with IEEE International Test Conference (ITC 2013)

    SESSION CHAIR:

    • ACM/IEEE Design Automation Conference (DAC 2018) for session “Arch Nemesis: Architectural Security”
    • IEEE International Symposium on Low Power Electronics and Design (ISLPED 2017) for session “Analog Circuit Design”
    • IEEE Engineering in Medicine and Biology Conference ( EMBC 2017) for session “Models for Clinical Decision Support” – Co-chair
    • IEEE International Test Conference (ITC 2014) for session “Modeling and Measuring Complex Analog Behaviors”
    • ACM/IEEE Design Automation Conference (DAC 2012) for session “The Dark Side of Test”
    • ACM/IEEE Design Automation Conference (DAC 2011) for session “New Methods and Metrics in Test and Reliability”
    • Firing Line Expert in IEEE International Test Conference 2014 (ITC 2014) for session “"Fool" Nyquist, Fix Nonlinearity, Tolerate Jitter”
    • IEEE National Aerospace Electronics Conference (NAECON 2016) for session “Emerging Electronics and Microsystems”

    OTHER:

    • DAC Invited Special Session Speaker, ACM/IEEE Design Automation Conference (DAC 2016), “Context-Adaptive and Energy-Efficient Communication for IoT Sensor Nodes”
    • ICCAD Invited Special Session Speaker, in IEEE International Conference on Computer‑Aided Design 2014 (ICCAD 2014), “Adaptive Designs in Computing, Power Management and Communication for Low-Power Circuits and Systems with Ultra-Wide Dynamic Ranges”
    • Industry Support Group Member, IEEE International Mixed-Signal Testing Workshop (IMSTW) 2015.
    • Industry Liaison for Systems On Nanoscale Information fabriCs (SONIC), 2014-2015

    JOURNAL REVIEWS:

    • IEEE Journal of Solid State Circuits (JSSC)
    • IEEE Journal of Microwave Theory and Techniques (MTT)
    • IEEE Transaction on Circuits & Systems I (TCAS I)
    • IEEE Transaction on Circuits & Systems II (TCAS II)
    • IEEE Transaction on Computer Aided Design (TCAD)
    • IEEE Transaction on Very Large Scale Integration (TVLSI)
    • IEEE Microwave and Wireless Components Letters (MWCL)
    • IEEE Design and Test Magazine (D&T)
    • ACM Transactions on Design Automation of Electronic Systems (TODAES)
    • IEEE Transactions on Biomedical Circuits and Systems (TBioCAS)
    • Springer Journal of Electronic Testing (JETTA)
    • ACM Journal on Emerging Technologies in Computing Systems (JETC)
    • IEEE Journal of Emerging and Selected Topics in Circuits and Systems (JETCAS)
    • Springer Journal of Medical Systems (JOMS)

    Conference Reviews:

    • ACM/IEEE Design Automation Conference (DAC)
    • IEEE International Test Conference (ITC)
    • IEEE Design, Automation & Test in Europe (DATE)
    • IEEE VLSI Test Symposium (VTS)
    • IEEE International Symposium on Low Power Electronics & Design (ISLPED)
    • IEEE International Conference on VLSI Design

    SPARC LAB participating at PURDUE NANODAYS with School Students