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Changes in ECE 658Engineering Faculty Document No. 53-06 May 10, 2007 TO: The Faculty of the College of Engineering FROM: The Faculty of the School of Electrical and Computer Engineering RE: ECE 658 Changes in Course Description and Content The faculty of the From: ECE 658 – Semiconductor Material and Device Characterization Sem. 2. Class 3, cr. 3 (Offered in alternate years.) Prerequisite: ECE 606. Authorized equivalent courses or consent of instructor may be used in satisfying course pre- and co-requisites. A comprehensive survey of modern characterization techniques routinely used to determine solid-state material and device parameters. Concepts and theory underlying the techniques are examined, and sample experimental results are presented. The coverage includes electrical, optical, chemical, and physical characterization methods. To: ECE 658 – Semiconductor Material and Device
Characterization Sem.2, even years. Class 3, cr. 3. Prerequisite: ECE 606. An examination of modern characterization techniques
routinely employed to determine semiconductor material and device
parameters. Concepts and theory
underlying the techniques are reviewed, and sample experimental results are
presented. Emphasis is on techniques
employing electrical measurements. Reason: The course description and content have been changed to reflect the increased emphasis on techniques employing electrical measurements. Mark Smith, Head School of Electrical & Computer Engineering Engineering Faculty Document No. 53-06 May 10, 2007 Page 1 of 1 ECE 658 – Semiconductor
Material and Device Characterization Required Text:
D. K. Schroder, Semiconductor Material and
Device Characterization, 3rd edition, John Wiley & Sons, Ó 2006; ISBN-13: 978-0-471-73906-7 and ISBN-10:
0-471-73906-5. Weeks Principal
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