Logs for EFD_33-19

ECE 65800: Semiconductor Material and Device Characterization

Action Status Note Timestamp
EFD Updated Approved 2018/12/07 16:16:54.761464 US/Eastern
EFD Updated ELT Review 2018/11/26 15:24:59.617727 US/Eastern
EFD Updated Inactive 2018/11/26 15:24:1.251136 US/Eastern
EFD Updated Inactive 2018/09/07 17:57:22.938112 GMT-4
EFD Created Inactive 2018/09/07 17:57:18.871015 GMT-4