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X-Ray Diffraction
Proto iXRD Mini
The Proto iXRD Mini is a compact, portable X-ray diffraction system that performs non-destructive phase identification and residual stress measurement in crystalline materials. It is widely used for validating heat treatment effects and manufacturing-induced stresses.
- Technique X-ray diffraction, sin²ψ multiple-exposure method
- Outputs Phase composition, residual stress
- Materials Ferrous and non-ferrous alloys
- Testing Mode Non-destructive
- X-ray Power 20 W (20 kV / 1 mA)
- Detectors Dual photon-counting, 20° detection width
- Mapping 50 mm linear mapping slide
- Portability 2.5 kg goniometer; full system packs into one travel case
Unique Capabilities
- Non-destructive residual stress measurementMeasures residual stress without damaging the part, so components can be tested before and after processing.
- Phase identificationIdentifies crystalline phases present in the material.
- Process validationQuantifies manufacturing-induced stresses and the effects of heat treatment.
In the Lab
Manufacturer Information
Publications Using This Machine
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