In this paper, we develop an end-to-end modeling framework to explore how various multiscale phenomena in solar cells translate from materials to module level. Specifically, the model captures the physics related to 1) the pressure-dependent grain growth of polycrystalline thin films (nanometers to micrometers), 2) averaging of the effects of grain-size distribution at the centimeter scale, and 3) effects of parasitic series and shunt resistance distributions on the efficiency of thin-film solar cell modules (centimeter to meter scale). As an idealized illustrative example, we consider a number of puzzling features that are associated with close space sublimated CdTe solar cells. The model explains both the increase in the grain size with deposition pressure, as well as the saturation of cell efficiency beyond a critical grain size. The analysis shows that grain geometry and grain-size distribution are unimportant for average grain sizes larger than 1 μm. The model attributes the significant efficiency loss at the module level to the series resistance and the operating point inhomogeneity caused by parasitic shunts. Overall, the model identifies opportunities for significant improvement at all length scales of thin-film solar cell technologies.