KSN Vikrant, RL Grosso, L. Feng, ENS Muccillo, DNF Muche, GS Jawaharram, CM Barr, AM Monterrosa, RHR Castro, RE García, K Hattar, SJ Dillon  “Ultrahigh Temperature in situ Transmission Electron Microscopy based Bicrystal Coble Creep in Zirconia I: Nanowire Growth and Interfacial Diffusivity.” Acta Materialia 199:530-541, 2020. https://doi.org/10.1016/j.actamat.2020.08.069

Abstract

This work demonstrates novel in situ transmission electron microscopy-based microscale single grain boundary Coble creep experiments used to grow nanowires through a solid-state process in cubic ZrO₂ between ≈ 1200 °C and ≈ 2100 °C. Experiments indicate Coble creep drives the formation of nanowires from asperity contacts during tensile displacement, which is confirmed by phase field simulations. The experiments also facilitate efficient measurement of grain boundary diffusivity and surface diffusivity. 10 mol% Sc₂O₃ doped ZrO₂ is found expressions for the cation grain boundary  and surface diffusivity.