[Bnc-faculty-all-list] Software for XRD analysis

[capano at ecn.purdue.edu]

Hello,

I wish to take advantage of this offer. For PIs that have one or two  
users, I can serve as the PI for their license. Let me know if you  
have a student or post-doc who will use XRD software.

Thanks,

Mike




Quoting "Abrol, Sangeeta Saddul" <abrols at purdue.edu>:

> Sent on behalf of Dmitry Zemlyanov
>
>
> Dear Colleagues,
>
> If your group uses the Panalytical XRD instrument at Birck, you  
> might interested in available Software for XRD analysis. Malvern  
> Panalytical Inc is running an Academia campaign right now where you  
> can use HighScore (Polycrystalline materials) and AMASS (Thin Films  
> and epitaxial layers) software for free for 1 year. This software  
> can be used for XRD peak identification. To be eligible, licenses  
> should be requested by identifiable Professors, Principal  
> Investigators or Group Leaders for a maximum of 3 students,  
> researchers, or post-doctoral associates. Here is where you can fill  
> out the form to receive this:  
> https://www.malvernpanalytical.com/en/academia/interact-with-us/free-software-licenses.
>
> Due to the limited nature of this offer, Malvern Panalytical Inc  
> only accepts applications from fully employed team leaders. Students  
> should ask their supervisor to apply on their behalf.
>
> Best regards,
>
> Dmitry Zemlyanov
>
> *****************************
>
> *****************************************
> Dmitry Zemlyanov, PhD
> Senior Research Scientist - Surface Science Application
> Purdue University Birck Nanotechnology Center,
> 1205 West State Street, West Lafayette, IN 47907-2057
> Tel.: +1 (765) 496-2457 (office - BRK 1274)
>       +1 (765) 496-6217 (lab - BRK 1077)
> Cell: +1 (765) 427-3813
> Fax:  +1 (765) 496-8299
> mailto:dzemlian at purdue.edu
> web:  
> https://www.purdue.edu/discoverypark/birck/facilities/equipment/Characterization/Surface-Characterization/Kratos%20X-ray%20Photoelectron%20Spectrometer.php
>