[Bnc-faculty-all-list] Software for XRD analysis

[Abrol, Sangeeta Saddul]

Sent on behalf of Dmitry Zemlyanov


Dear Colleagues,

If your group uses the Panalytical XRD instrument at Birck, you might interested in available Software for XRD analysis. Malvern Panalytical Inc is running an Academia campaign right now where you can use HighScore (Polycrystalline materials) and AMASS (Thin Films and epitaxial layers) software for free for 1 year. This software can be used for XRD peak identification. To be eligible, licenses should be requested by identifiable Professors, Principal Investigators or Group Leaders for a maximum of 3 students, researchers, or post-doctoral associates. Here is where you can fill out the form to receive this: https://www.malvernpanalytical.com/en/academia/interact-with-us/free-software-licenses.

Due to the limited nature of this offer, Malvern Panalytical Inc only accepts applications from fully employed team leaders. Students should ask their supervisor to apply on their behalf.

Best regards,

Dmitry Zemlyanov

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Dmitry Zemlyanov, PhD
Senior Research Scientist - Surface Science Application
Purdue University Birck Nanotechnology Center,
1205 West State Street, West Lafayette, IN 47907-2057
Tel.: +1 (765) 496-2457 (office - BRK 1274)
      +1 (765) 496-6217 (lab - BRK 1077)
Cell: +1 (765) 427-3813
Fax:  +1 (765) 496-8299
mailto:dzemlian at purdue.edu
web: https://www.purdue.edu/discoverypark/birck/facilities/equipment/Characterization/Surface-Characterization/Kratos%20X-ray%20Photoelectron%20Spectrometer.php
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