ECE608 - Fall 17



Tentative Syllabus (updated 8/17/17)
Emergency Information


Wednesday, September 13: Professor Pomeranz will have extra office hours today at 2:30-3:30pm. Apologies to students who stopped by yesterday between 4:30-5:00pm.

Please show up for class on time and do not enter the classroom if you arrive late.

If you are missing a copy of a lecture handout you can ask Dee Dee Dexter in MSEE268 for a copy.

There will not be makeup quizzes.

Estimated grades are available before the end of the semester. However, any estimate that is given before final grades are due is only an estimate, and the final grade may be different from the estimate.

Because of the number of students in the class it will be close to impossible to answer questions during the quizzes. Please try to avoid asking questions. If you need to make an assumption in order to solve a quiz, write the assumption clearly. Correct answers that are based on reasonable assumptions will be given full credit. If you must ask a question raise your hand and wait for permission to get up and talk with the professor in the front of the classroom.

Quiz grades will be available in Professor Pomeranz' office during office hours:
MSEE234, TTh 4-5pm, or send an e-mail (pomeranz@ecn.purdue.edu) for a time on TTh 10am-6pm. Please specify several preferred times.
Grades will NOT be sent through e-mail.

Assignment
Assignment Due 11/21/17
Submit the assignments in class or give them to Dee Dee Dexter in MSEE268 before 4:30pm on the due date.
Assignments should be typed.
It is recommended that you do not start working on the assignment until we have covered the relevant material in class.

Sample Problems
Chapters 1, 2, 3
Appendix A
Chapter 4
Chapter 5
Appendix B
Chapter 6
Chapter 7
Chapter 8
Chapter 9
Chapter 10
Chapter 11
Chapter 12
Chapter 22
Chapter 23
Chapter 16
Chapter 24,25
Chapter 15
Chapter 26
Chapter 34
Chapter 35

It is possible to use the second or third edition of the textbook.
When there is a difference in sample problems it will be posted here:
2nd edition 6.5-8 == 3rd edition 6.5-9
Ignore problem 12.3-4
22.2-6 in the solution is actually 22.2-5
22.2-7 in the solution is actually 22.2-6
2nd edition 22.2-5 == 3rd edition 22.2-6
2nd edition 22.2-6 == 3rd edition 22.2-7
2nd edition 22.3-7 == 3rd edition 22.3-8
2nd edition 22.3-8 == 3rd edition 22.3-9
2nd edition 16.1-4 == 3rd edition 16.1-3
2nd edition 16.1-3 == 3rd edition 16.1-4
2nd edition 16.3-3 == 3rd edition 16.3-4
2nd edition 16.3-7 == 3rd edition 16.3-8
2nd edition 24.3-8 == 3rd edition 24.3-10
2nd edition 15.2-4 == 3rd edition 15.2-5
2nd edition 15.2-5 == 3rd edition 15.2-6
2nd edition 15.5 == 3rd edition 15.7
2nd edition 26.1-7 == 3rd edition 26.1-4
2nd edition 26.1-9 == 3rd edition 26.1-6
2nd edition 26.2.9 == 3rd edition 26.2.11

Solutions to quizzes:
F17 Quiz 1
F17 Quiz 2
F17 Quiz 3
F17 Quiz 4
F17 Quiz 5
F17 Quiz 6
F17 Quiz 7
F17 Quiz 8
F17 Quiz 9
F17 Quiz 10

Sample Quizzes (F16)
F16 Quiz 1
F16 Quiz 2
F16 Quiz 3
F16 Quiz 4
F16 Quiz 5
F16 Quiz 6
Note: No points were deducted for different answers to Part 2.
F16 Quiz 7
F16 Quiz 8
F16 Quiz 9
F16 Quiz 10
F16 Quiz 11
F16 Quiz 12
F16 Quiz 13
F16 Quiz 14

Sample Quizzes (F15)
F15 Quiz 1
F15 Quiz 2
F15 Quiz 3
F15 Quiz 4
F15 Quiz 5
F15 Quiz 6
F15 Quiz 7
F15 Quiz 8
F15 Quiz 9
F15 Quiz 10
F15 Quiz 11
F15 Quiz 12
F15 Quiz 13

Sample Quizzes (S15)
S15 Quiz 1
S15 Quiz 2
S15 Quiz 3
S15 Quiz 4
S15 Quiz 5
S15 Quiz 6
S15 Quiz 7
S15 Quiz 8
S15 Quiz 9
Note: acceptable answers for parts 1 and 2 of quiz 9 can use the original or reordered indices of the activities, or pairs of start,end times.
S15 Quiz 10
S15 Quiz 11
S15 Quiz 12


Sample Quizzes (F14)
F14 Quiz 1
F14 Quiz 2
F14 Quiz 3
F14 Quiz 4
F14 Quiz 5
F14 Quiz 6
F14 Quiz 7
F14 Quiz 8
F14 Quiz 9
F14 Quiz 10
F14 Quiz 11
F14 Quiz 12
F14 Quiz 13
F14 Quiz 14
F14 Quiz 15


Sample Quizzes (F13)
F13 Quiz 1
F13 Quiz 2
F13 Quiz 3
F13 Quiz 4
F13 Quiz 5
F13 Quiz 6
F13 Quiz 7
F13 Quiz 8
F13 Quiz 9
F13 Quiz 10
F13 Quiz 11
F13 Quiz 12
F13 Quiz 13
F13 Quiz 14


Irith Pomeranz

Professor of Electrical and Computer Engineering



Address

Purdue University
School of Electrical and Computer Engineering
1285 Electrical Engineering Building
West Lafayette, Indiana 47907-1285
Phone: +1 765 494-3357
Fax: +1 765 494-3371
Email: pomeranz@ecn.purdue.edu

Academic Degrees


1985 - B. Sc. in Computer Engineering (Summa Cum Laude), Department of Electrical Engineering, Technion, Israel.
1989 - D. Sc., Department of Electrical Engineering, Technion, Israel.

Academic Appointments


1989-1990 Lecturer, Department of Computer Science, Technion, Israel.
1990-1994 Assistant Professor, Department of Electrical and Computer Engineering, University of Iowa.
1994-1998 Associate Professor, Department of Electrical and Computer Engineering, University of Iowa.
July - December 1995 Visiting Associate Professor, Department of Electrical Engineering, Stanford University.
1998-2000 Professor, Department of Electrical and Computer Engineering, University of Iowa.
2000-present Professor, School of Electrical and Computer Engineering, Purdue University.

Awards


1992 - Best paper award, European Design Automation Conference (EURO-DAC '92).
1993 - Best paper award nomination, Design Automation Conference (DAC '93).
1993 - National Science Foundation Young Investigator Award (NYI).
1993 - Best paper award nomination, European Design Automation Conference (EURO-DAC '93).
1993 - Best paper award, European Design Automation Conference (EURO-DAC '93).
1997 - University of Iowa Faculty Scholar Award.
1999 - IEEE Fellow.

Research Interests and Recent Publications

Test Generation, Design-for-testability, Built-in Self-test and Diagnosis of VLSI Circuits

Test Generation
  • I. Pomeranz, S. M. Reddy and R. Guo, "Static Test Compaction for Synchronous Sequential Circuits Based on Vector Restoration", IEEE Transactions on Computer-Aided Design, July 1999, pp. 1040-1049.
  • I. Pomeranz and S. M. Reddy, "Pattern Sensitivity: A Property to Guide Test Generation for Combinational Circuits", in Proc. 8th Asian Test Symp., Nov. 1999, pp. 75-80.
  • I. Pomeranz and S. M. Reddy, "On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults", IEEE Transactions on Computer-Aided Design, March 2000, pp. 372-383.

Design-for-testability
  • I. Pomeranz and S. M. Reddy, "On Achieving Complete Coverage of Delay Faults in Full Scan Circuits using Locally Available Lines", in Proc. 1999 Intl. Test Conf., Oct. 1999, pp. 923-931.
  • I. Pomeranz and Y. Zorian, "On Testing of Non-Isolated Embedded Legacy Cores and their Surrounding Logic", in Proc. 17th VLSI Test Symp., April 1999, pp. 41-48.

Built-in Self-test
  • I. Pomeranz and S. M. Reddy, "Built-In Test Sequence Generation for Synchronous Sequential Circuits Based on Loading and Expansion of Test Subsequences", in Proc. 36th Design Autom. Conf., June 1999, pp. 754-759.
  • Y. Huang, I. Pomeranz, S. M. Reddy and J. Rajski "Improving the Proportion of At-Speed Tests in Scan BIST", in Proc. Intl. Conf. on Computer-Aided Design, Nov. 2000.

Diagnosis
  • I. Pomeranz and S. M. Reddy, "A Diagnostic Test Generation Procedure Based on Test Elimination by Vector Omission for Synchronous Sequential Circuits", IEEE Transactions on Computer-Aided Design, May 2000, pp. 589-600.
  • I. Pomeranz and S. M. Reddy, "On Diagnosis of Pattern-Dependent Delay Faults", in Proc. 37th Design Automation Conf., June 2000, pp. 59-62.

Professional Service

Conference and Workshop Program Committees (2000-2001) Conference Program Chair and Subcommittee Chair Editorial Boards

M.S. Graduates at Purdue


Masao Naruse
Mesut Meterelliyoz
Anil Singhar
Yixi Yang

Ph.D. Graduates at Purdue


Enamul Amyeen
Yonsang Cho
Bharath Seshadri
Hangkyu Lee
Sungchul Park
Dongok Kim

Current Ph.D. Students


Bo Yao