%0 Conference Proceedings %B Device Research Conference (DRC), 2013 71st Annual %D 2013 %T Atomistic Simulation on Gate-recessed InAs/GaSb TFETs and Performance Benchmark %A Jiang, Zhengping %A He, Yu %A Zhou, Guangle %A Kubis, Tillmann C %A Xing, Huili %A Klimeck, Gerhard %P 145--146 %Z Device Research Conference (DRC),Page(s): 145 - 146, June 2013, Notre Dame, IN, USA; doi: 10.1109/DRC.2013.6633835