%0 Journal Article %J IEEE Transactions on Nanotechnology %D 2018 %T Atomistic tight-binding study of contact resistivity in Si/SiGe PMOS Schottky contacts %A Sarangapani, Prasad %A Weber, Cory %A Chang, Jiwon %A Cea, Stephen %A Povolotskyi, Michael %A Klimeck, Gerhard %A Kubis, Tillmann C %P 1-1 %V Early Access %Z IEEE Transactions on Electron Devices, 2018 (Early Access), Pages 1-1