%0 Conference Proceedings %B Electron Devices Meeting (IEDM), 2009 IEEE International %D 2009 %T Performance Analysis of Ultra-Scaled InAs HEMTs %A Kharche, Neerav %A Klimeck, Gerhard %A Kim, Dae-Hyun %A Alamo, Jesús. %A Luisier, Mathieu %P 1-4 %Z IEDM 2009, Dec. 7-9, 2009.Page(s):1-4;doi:10.1109/IEDM.2009.5424315 %1 10.1109/IEDM.2009.5424315