%0 Conference Proceedings %B proceedings of the the 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) %D 2017 %T Assessment of Si/SiGe PMOS Schottky contacts through atomistic tight binding simulations: Can we achieve the 10−9Ω·cm? target? %A Sarangapani, Prasad %A Weber, Cory %A Chang, Jiwon %A Cea, Stephen %A Golizadeh-Mojarad, Roksana %A Povolotskyi, Michael %A Klimeck, Gerhard %A Kubis, Tillmann C %P 83-84 %Z Proceedings of the 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), Pages 83-84