%0 Journal Article %J Semiconductor Science and Technology %D 1998 %T Numerical Approximations to the Treatment of Interface Roughness Scattering in Resonant Tunneling Diodes %A Klimeck, Gerhard %A Lake, Roger %A Blanks, Daniel %P A165 %V 13 %Z Semicond. Sci. Technology, Vol 13, pg. A165 (1998); doi : 10.1088/0268-1242/13/8A/047 %1 10.1088/0268-1242/13/8A/047