@article{1330park2013, author = "Seung Hyun Park and Neerav Kharche and D. Basu and Zhengping Jiang and Saroj K.Nayak and C. Weber and Ganesh Hegde and K. Haume and Tillmann C Kubis and Michael Povolotskyi and Gerhard Klimeck", title = "Scaling Effect on Specific Contact Resistivity in Nanoscale Metal-Semiconductor Contacts", year = "2013", note = " Device Research Conference (DRC), University of Notre Dame, IN, June 23-26, 2013, Page(s): 125 - 126, and International Workshop on Computational Electronics (IWCE), Nara, Japan, June 4-7, 2013; doi: 10.1109/DRC.2013.6633825", url = "http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6633825", }