%0 Journal Article %J IEEE Electronic Device Letters %D 2011 %T Intrinsic Reliability improvement in Biaxially Strained SiGe p-MOSFETs %A Deora, Shweta %A Paul, Abhijeet %A R, Bijesh %A Huang, Jeff %A Klimeck, Gerhard %A Bersuker, Gennadi %A Krisch, Paul %A Jammy, Raj %I IEEE %N 3 %P 255-257 %V 32 %Z IEEE Electron Device Letters, Vol. 32, Issue: 3, pags 255-257, March 2011;doi:10.1109/LED.2010.2099101 %1 10.1109/LED.2010.2099101