Microstructural Characterization Techniques
Learning Objective:Students will learn what tool to use for materials analysis/characterization; will become familiar with all major techniques for analysis of microstructural features, both structural and chemical; will know which techniques are most useful for their particular situations; and will understand the fundamental workings and limitations of the techniques and instruments.
Measurement and metrology is continually one of the most active areas in the study and verification of materials and their processing. Materials structure at the micro- and nano-scales must be carefully controlled and monitored in modern industry and research. Knowing what tools to use for materials analysis/characterization, and being able to judge the plausibility of others people's claims, are crucial skills in the current work environment. Successful students will be familiar with all major techniques for analysis of microstructural features, both structural and chemical. The student will be aware of what technique is useful for particular situations, and understand the fundamental workings and limitations of the techniques and instruments.
Topics Covered:Use and function of major techniques; relations between techniques are used to highlight the strengths and weaknesses of each; Specific material analysis examples are also used to illustrate these; Major areas are imaging (optical and electron microscopies, and surface probe techniques), diffraction (light, x-ray, electron, neutron, and other, including effects on imaging), and spectroscopy (chemical analysis from selected areas).
Prerequisites:Completion of and familiarity with sophomore-level mathematics and physics for engineering and physical sciences, plus some familiarity with basic materials science concepts.
Applied / Theory:50 / 50
Web Content:Syllabus, Lecture Notes, Homework Assignments and Solutions.
Homework:Alternate-week assignments; will be accepted via e-mail to email@example.com.
Projects:Required term paper, student chooses topic (instrument or technique for microstructural analysis). Written documentation, no presentation needed. Will not visit off-campus locations.
Exams:Two exams and one final exam.
Textbooks:Official textbook information is now listed in the Schedule of Classes. NOTE: Textbook information is subject to be changed at any time at the discretion of the faculty member. If you have questions or concerns please contact the academic department.
Tentative: Required--none. List of recommended and reference textbooks available from Professor.