FEI Philips XL-40 Scanning Electron Microscope


FeaturesT300_004

  • Schottky FEG
  • Large chamber
  • Secondary Electron Imaging
  • EBSD (operation limited to super users)
  • EDS (thin window)

Location

  • ARMS B218

Administration

Resources

Equipment reservations: (Coral)
Basic operation manual (XL-40 User Manual)
Mail List (XL-40 Mail List)  [You will be sent email requesting confirmation, to prevent others from gratuitously subscribing you. This is a private list, which means that the list of members is not available to non-members.]
 
Other Microscopes
­

School of Materials Engineering
Electron Microscopy Facilities