JEOL Scanning Electron Microscope
(JSM-T300 SEM B)


FeaturesT300_004

  • Secondary Electron Imaging
  • Backscatter Imaging
  • EDS

Location

  • ARMS B216

Related Classes

  • MSE 597 Scanning Electron Microscopy is a prerequisite for all student users (Formerly known as MSE 581)

 Administration

Resources

Equipment reservations: (Coral)
Basic operation manual (Link)
Mail List (T300 Mail List)
 
 
Other Microscopes
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School of Materials Engineering
Electron Microscopy Facilities