[S-4800-list] SEM problem

[Chang Wan Han]

Hi Heng,

Since the fragments are on the sample transfer, we may not take your sample out until the microscope service engineer visit. i may try but that would damage the sample transfer system. i'll report this to the service engineer first. Hardware problem is out of my control. Please report this problem through Coral.

Dear All,

S-4800 will not be operational until further notice.

Chang



> On Feb 17, 2015, at 9:41 PM, Heng Wu <hengw at purdue.edu> wrote:
> 
> Sorry again for this accident. 
> 
>> ON 2/17/2015 9:21 PM, Chang Wan Han wrote:
>> Oh no. That shouldn’t happen. Could you explain how glass slides were broken in the SEM?
>> 
>> Chang
>> 
>> ---------------------------------
>> Chang Wan Han
>> Graduate Student
>> School of Materials Engineering
>> Purdue University
>> Call: +1-765-337-1406
>> Email: changwan at purdue.edu
>> --------------------------------
>> 
>>> On Feb 17, 2015, at 9:20 PM, Heng Wu <hengw at purdue.edu> wrote:
>>> 
>>> Dear Changwan,
>>> 
>>> Sorry to disturb you.
>>> 
>>> This's Heng Wu. I used the S-4800 SEM tonight for a cross section imaging. However, the glass slide which carries my sample broke inside the SEM chamber and fall onto the transfer carrier. Can you help me take my sample out of the chamber? I'm really appreciated.
>>> 
>>> Sorry again for this trouble and happy Chinese New year.
>>> 
>>> Bests,
>>> 
>>> -- 
>>> Heng Wu
>>> Ph.D. student
>>> Birck Nanotechnology Center
>>> School of Electrical and Computer Engineering
>>> College of Engineering, Purdue University
>>> West Lafayette, IN, USA
> 
> -- 
> Heng Wu 
> Ph.D. student
> Birck Nanotechnology Center
> School of Electrical and Computer Engineering 
> College of Engineering, Purdue University 
> West Lafayette, IN, USA 
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