[Bnc-faculty-all-list] Call for Proposals: National Center for Electron Microscopy

[Schwartz, Melissa J]

MEMO:
From: Jane L. Cavlina
Sent: December 1, 2010
To:      BNC- Faculty
Subject: Call for Proposals: National Center for Electron Microscopy
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Subject: Call for Proposals: National Center for Electron Microscopy
Deadline:   12/15/10
Dear Colleagues,
The National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, a DOE User Facility for Electron Scattering, is currently accepting research proposals for the next quarterly deadline of December 15, 2010.
The mission of the National Center for Electron Microscopy (NCEM) is to provide scientists from universities, government and industrial laboratories with cutting-edge instrumentation, techniques and expertise for advanced electron beam microcharacterization of materials at high spatial resolution. Access to NCEM is free of charge for research that is in the public domain and intended for open publication.
NCEM is one of the world's foremost centers for electron optical microcharacterization with a resident staff of scientists who conduct high-level research and collaborate with external research groups to maximize the impact of electron optical methods on materials science. NCEM's major focus is in the following areas of research: Defects and deformation; Mechanisms and kinetics of phase transformations; Nanostructured materials; Surfaces, interfaces and thin films.
Prospective users are encouraged to contact NCEM staff to discuss proposal ideas in advance of submission and to learn more about special capabilities of particular interest (see the Staff section of the NCEM web page). Approved projects will receive user access and work can begin as soon as possible after this notification.
The following instruments are accessible to users:
* Aberration-corrected TEAM microscopes (TEAM 0.5 and TEAM I)
* One-Angstrom Microscope (CM300)
* CM200/FEG Analytical TEM/STEM
* Spin-Polarized Low-Energy Electron Microscope
* JEOL 3010 In-situ TEM
* FEI Dual-beam FIB
* Monochromated FEI Tecnai F20 TEM/STEM
* Monochromated Zeiss Libra TEM/STEM
 All proposals will be reviewed for feasibility, safety, and potential for high-impact science. Users for approved projects must complete access and training requirements prior to beginning experiments. If you have any questions please contact NCEM's administrator JLCavlina at lbl.gov<mailto:JLCavlina at lbl.gov>
To submit a proposal online, or obtain further information, please visit the NCEM website at:
http://ncem.lbl.gov/
 Jane L. Cavlina
Administrator
National Center for Electron Microscopy
Lawrence Berkeley Lab
MS 72-150
One Cyclotron Road
Berkeley, CA 94720


Sent on the behalf of Dr. Monica Allain

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