[BNC-all] Seminar: "Advanced Metrology of Electronic Devices in Operating Mode Inside the Scanning Transmission Electron Microscope"

[Dilley, Neil R]

Advanced Metrology of Electronic Devices in Operating Mode Inside the Scanning Transmission Electron Microscope
William A. Hubbard, CEO, NanoElectronic Imaging, Inc., CA

Friday November 15th, 2024 @ 1:30 pm in BRK_1001
Zoom link to seminar
https://purdue-edu.zoom.us/j/98487769216<https://nam04.safelinks.protection.outlook.com/?url=https%3A%2F%2Fpurdue-edu.zoom.us%2Fj%2F98487769216&data=05%7C02%7Cbnc-all%40ecn.purdue.edu%7C3b342219983841d7e7d808dd02924961%7C4130bd397c53419cb1e58758d6d63f21%7C0%7C0%7C638669549495120904%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=%2But0qzKun31ymcdGwK18BvV%2BQ9tRgT8JV6nBLvVC2xE%3D&reserved=0>

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--
Neil R. Dilley, Ph.D.
Research Manager
Birck Nanotechnology Center , Rm 1014
1205 Mitch Daniels Blvd.
West Lafayette, IN  47907-2057
765-496-6080

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