[BNC-all] Upcoming seminar by Keysight on "Advanced High Frequency Device Characterization"

[Abrol, Sangeeta Saddul]

Hello All -

Please be advised of an upcoming seminar on Advanced High-Frequency Device Characterization. It will be on February 8 from 12:00 PM - 3:00 PM at BRK 1001. The speakers are Mark Johnson and Jon Kinney from Keysight Technologies.

The seminar will pertain to the new high frequency device characterization capabilities in Birck. This seminar will begin by covering the basics of time domain instrumentation such as oscilloscopes and arbitrary waveform generators. It will focus on Keysight's Ultra High Performance UXR Oscilloscope coupled with the 92 GSa/s M8196A Arbitrary Waveform Generator which offer unparalleled flexibility for both digital and RF analysis. The UXR platform spans 10 - 110 GHz of bandwidth and can provide 2 GHz of digital down conversion anywhere in its entire bandwidth span. The 92 GSa/s M8196A has 32 GHz of bandwidth, sub 9ps risetimes, and frequency response compensation to help clean up non-ideal signal paths. Finally, after reviewing the highlights of current relevant research within the groups and staff, Keysight will provide best practices and recommendation on how to utilize and maximum capability of new equipment to achieve desired data sets and measurement results.

Lunch will be provided, so RSVP is required. Attendees can just send me an email at dekaa at purdue.edu<mailto:dekaa at purdue.edu>. The poster for the seminar is attached herewith.

Regards,
Angshuman

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Angshuman Deka, PhD
Research Scientist
Birck Nanotechnology Center, Room 1014
Purdue University
West Lafayette, IN, USA 47906

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