[BNC-all] New Keithley 4200 4200-SCS/F IV-CV measurement system

[Mahmood, Aamer]

Hello all,
We are getting a brand new Keithley 4200-SCS/F IV-CV measurement system for the Electrical Characterization lab (BRK 2261). I plan to have it attached to probe station 2 while the older (current) Keithley system can be moved into the cleanroom with the probe station there. 
The new Keithley will be able to do both IV and CV measurements. It is expected to be delivered around mid October 2010 (tentative).
As part of the deal with the suppliers, Lee Stauffer, the Senior Staff Technologist for Keithley Semiconductor Measurements group will spend two days at Birck and give a seminar on low level measurements, as well as hands on training on the new system. This is a unique opportunity and we can get greater benefit from it by having the seminar(s) customized to our requirements. I therefore encourage users at BRK who anticipate making IV and/or CV measurements for their research, to send me a brief description of your experiments/measurements and I can arrange Lee to address them in detail.
Please send me the information by Friday September 24, 2010.
Thanks.
--
Aamer Mahmood
Microfab Research Engineer
Birck Nanotechnology Center
Discovery Park, Purdue University
1205 West State Street
West Lafayette, IN 47907
USA
Tel: +1(765) 494 6697