Overview
- Collects the state-of-the-art research on dependability and analytics
- Includes the latest resulting from approaching system dependability from data, system and analytics perspectives
- Is contributed to many internationally recognized experts
Part of the book series: Springer Series in Reliability Engineering (RELIABILITY)
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Table of contents (27 chapters)
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Front Matter
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Software Dependability
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Front Matter
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Large-Scale Systems and Data Analytics
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Front Matter
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Keywords
About this book
This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.
The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008–2011. The book contains chapters written by many of his former students.
Editors and Affiliations
About the editors
Karthik Pattabiraman is Professor of Electrical and Computer Engineering at the University of British Columbia (UBC). He is currently Vice Chair of the IFIP Working Group on Dependable Computing and Fault Tolerance (WG 10.4) and is Senior Member of the IEEE and Distinguished member of the ACM.
Catello (Lelio) Di Martino is principal researcher and leader of ecosystems in the Network Systems and Security Research Laboratory of Nokia Bell Labs. His research focuses on highly resilient large-scale communication systems (including 6G) , SLA-driven network automation, chaos engineering, industrial internet of things, and data-intensive systems.
Arjun P. Athreya is Assistant Professor in the Dept. Of Molecular Pharmacology and Experimental Therapeutics, College of Medicine, Mayo Clinic, Rochester, MN, USA.
Saurabh Bagchi is Professor at Purdue University and International Visiting Faculty at the Indian Institute of Technology at Kharagpur. He is the founding Director of the CRISP Research Center at Purdue University and the co-founder of a cloud startup KeyByte. He is an IEEE Computer Society Golden Core Member, Distinguished Contributor, and Distinguished Visitor.
Bibliographic Information
Book Title: System Dependability and Analytics
Book Subtitle: Approaching System Dependability from Data, System and Analytics Perspectives
Editors: Long Wang, Karthik Pattabiraman, Catello Di Martino, Arjun Athreya, Saurabh Bagchi
Series Title: Springer Series in Reliability Engineering
DOI: https://doi.org/10.1007/978-3-031-02063-6
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerland AG 2023
Hardcover ISBN: 978-3-031-02062-9Published: 26 July 2022
Softcover ISBN: 978-3-031-02065-0Published: 26 July 2023
eBook ISBN: 978-3-031-02063-6Published: 25 July 2022
Series ISSN: 1614-7839
Series E-ISSN: 2196-999X
Edition Number: 1
Number of Pages: XI, 433
Number of Illustrations: 38 b/w illustrations, 70 illustrations in colour
Topics: Engineering Economics, Organization, Logistics, Marketing, Mathematical Modeling and Industrial Mathematics, Risk Management, Industrial Organization