Two XPS workshops will be coming in May, 2015. Dmitry Zemlyanov, Senior Research Scientist at Birck Nanotechnology believes every research group using or planning to use Surface Analysis characterization tools should have at least one trained student.

1) Introduction to XPS workshop - What you should know about X-ray photoelectron spectroscopy (https://purdue.qualtrics.com/SE/?SID=SV_2aEjFISmtrn3IlD), May 19-20 @ 9:00 AM - BRK 1001.

Course Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surface. The course will teach how and what information can be provided by XPS.

2) XPS Lite Workshop Introduction to CasaXPS (https://purdue.qualtrics.com/SE/?SID=SV_4ON5fLuUSipSyuV), May 26-27 @ 9:00 AM - BRK 1001.

Course Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surface. however, XPS data require thorough analysis, and dedicated software is used for data analysis. purdue University has a site license for CasaXPS allowing complete analysis XPS data. The course aims to teach (1) what analysis should be applied to raw XPS data and (2) how this can be done using CasaXPS. Qualitative and quantitative analysis of XPS data using CasaXPS will be discussed in detail as well. Participants are encouraged to bring their own laptops to follow data analysis using CasaXPS.

See attached flyers for more details.