{"id":439,"date":"2017-11-03T16:36:07","date_gmt":"2017-11-03T16:36:07","guid":{"rendered":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/?p=439"},"modified":"2017-11-03T16:36:07","modified_gmt":"2017-11-03T16:36:07","slug":"se-leach-re-garcia-v-nagarajan-edge-and-finite-size-effects-in-polycrystalline-ferroelectrics-acta-materialia-591191-201-2011","status":"publish","type":"post","link":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/11\/03\/se-leach-re-garcia-v-nagarajan-edge-and-finite-size-effects-in-polycrystalline-ferroelectrics-acta-materialia-591191-201-2011\/","title":{"rendered":"SE Leach, RE Garc\u00eda, V Nagarajan “Edge and finite size effects in polycrystalline ferroelectrics.” Acta Materialia. 59(1):191-201, 2011."},"content":{"rendered":"

SE Leach, RE Garc\u00eda, V Nagarajan “Edge and finite size effects in polycrystalline ferroelectrics<\/a>.” Acta Materialia<\/strong>. 59(1):191-201, 2011.<\/p>\n

Abstract<\/h3>\n
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This paper proposes a method to engineer the effects of mesa aspect ratio on polarization switching for single-crystal and polycrystalline PZT nanostructures. The out-of-plane polarization switching of single-crystal and polycrystalline structures as a function of crystallographic orientation, epitaxial strain and mesa aspect ratio are explored. The results are summarized in terms of the mesa geometrical parameters, crystallographic orientation and expitaxial strain. The results demonstrate a strong correlation of single-crystal properties to the polarization hysteresis behavior of a central representative grain in a polycrystalline film. The average remnant polarization and its reliability are controlled through the aspect ratio of the mesa. Calculations demonstrate that the stresses at the edges are relaxed for film height, h<\/em>f<\/em><\/sub>, to mesa width, w<\/em>, ratios h<\/em>f<\/em><\/sub>\/w<\/em>\u00a0\u2a7d\u00a01\u00a0\u00d7\u00a010\u22124<\/sup>. For h<\/em>f<\/em><\/sub>\/w<\/em>\u00a0\u2a7e\u00a01\u00a0\u00d7\u00a010\u22122<\/sup>, the effective in-plane stress is relaxed throughout the deposited film. Moreover, the effective stresses at the center of the mesa are 15% of the stresses of an infinite film.<\/p>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

SE Leach, RE Garc\u00eda, V Nagarajan “Edge and finite size effects in…<\/p>\n

Continue reading “SE Leach, RE Garc\u00eda, V Nagarajan “Edge and finite size effects in polycrystalline ferroelectrics.” Acta Materialia. 59(1):191-201, 2011.”<\/span>…<\/a><\/div>\n
Continue reading \"SE Leach, RE Garc\u00eda, V Nagarajan “Edge and finite size effects in polycrystalline ferroelectrics.” Acta Materialia. 59(1):191-201, 2011.\"<\/span>…<\/a><\/div>","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"advanced_seo_description":"","jetpack_publicize_message":"","jetpack_is_tweetstorm":false,"jetpack_publicize_feature_enabled":true},"categories":[45],"tags":[11,10,14,16],"jetpack_publicize_connections":[],"jetpack_featured_media_url":"","jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/peeeSR-75","jetpack_likes_enabled":true,"jetpack-related-posts":[{"id":385,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/collective-dynamics-in-nanostructured-polycrystalline-ferroelectric-thin-films-using-local-time-resolved-measurements-and-switching-spectroscopy\/","url_meta":{"origin":439,"position":0},"title":"S Wicks, K Seal, S Jesse, V Anbusathaiah, S Leach, RE Garc\u00eda, S V Kalinin, V Nagarajan “Collective dynamics in nanostructured polycrystalline ferroelectric thin films using local time-resolved measurements and switching spectroscopy.” \u00a0Acta Materialia. 58(1):67-75, 2010.","date":"10\/31\/2017","format":false,"excerpt":"S Wicks, K Seal, S Jesse, V Anbusathaiah, S Leach, RE Garc\u00eda, S V Kalinin, V Nagarajan \"Collective dynamics in nanostructured polycrystalline ferroelectric thin films using local time-resolved measurements and switching spectroscopy.\" \u00a0Acta Materialia. 58(1):67-75, 2010. Abstract Grain-to-grain long-range interactions and the ensuing collective dynamics in the domain behavior of\u2026","rel":"","context":"In "Papers"","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":346,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/virtual-piezoforce-microscopy-of-polycrystalline-ferroelectric-films\/","url_meta":{"origin":439,"position":1},"title":"RE Garc\u00eda, BD Huey, JE Blendell “Virtual piezoforce microscopy of polycrystalline ferroelectric films.”\u00a0Journal of applied physics, 100:064105, 2006.","date":"10\/31\/2017","format":false,"excerpt":"RE Garc\u00eda, BD Huey, JE Blendell \"Virtual piezoforce microscopy of polycrystalline ferroelectric films.\"\u00a0Journal of applied physics, 100:064105, 2006. Abstract An innovative methodology is presented that utilizes the experimental results of electron backscattered diffraction to map the crystallographic orientation of each grain, the finite element method to simulate the local grain-grain\u2026","rel":"","context":"In "Papers"","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":500,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/11\/04\/y-jing-s-leach-re-garcia-je-blendell-correlated-inter-grain-switching-in-polycrystalline-ferroelectric-thin-films-journal-of-applied-physics-11612124102-2014\/","url_meta":{"origin":439,"position":2},"title":"Y Jing, S Leach, RE Garc\u00eda, JE Blendell “Correlated inter-grain switching in polycrystalline ferroelectric thin films.”\u00a0Journal of Applied Physics, 116(12):124102, 2014.","date":"11\/04\/2017","format":false,"excerpt":"Y Jing, S Leach, RE Garc\u00eda, JE Blendell \"Correlated inter-grain switching in polycrystalline ferroelectric thin films.\"\u00a0Journal of Applied Physics, 116(12):124102, 2014. Abstract Ferroelectric domain switching within individual nanoscale grains of a 100\u2009nm thick polycrystalline PbZr0.2Ti0.8O3 thin film has been shown to depend on the relative crystallographic orientation of the adjacent\u2026","rel":"","context":"In "Papers"","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":436,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/11\/03\/z-zhao-k-bowman-re-garcia-modeling-180-domain-switching-population-dynamics-in-polycrystalline-ferroelectrics-journal-of-the-american-ceramic-society-9551619-1627-2012\/","url_meta":{"origin":439,"position":3},"title":"Z Zhao, K Bowman, RE Garc\u00eda “Modeling 180\u00b0 Domain Switching Population Dynamics in Polycrystalline Ferroelectrics.”\u00a0Journal of the American Ceramic Society. 95(5):1619-1627, 2011.\u00a0","date":"11\/03\/2017","format":false,"excerpt":"Z Zhao, K Bowman, RE Garc\u00eda \"Modeling 180\u00b0 Domain Switching Population Dynamics in Polycrystalline Ferroelectrics.\"\u00a0Journal of the American Ceramic Society. 95(5):1619-1627, 2011. AbstracT The macroscopic hysteretic response associated to the underlying microscopic 180\u00b0 switching of domains in a polycrystalline ferroelectric system is investigated for bipolar, sesquipolar, and unipolar electrical loadings.\u2026","rel":"","context":"In "Papers"","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":352,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/correlations-between-the-crystallographic-texture-and-grain-boundary-character-in-polycrystalline-materials\/","url_meta":{"origin":439,"position":4},"title":"RE Garc\u00eda, MD Vaudin “Correlations between the crystallographic texture and grain boundary character in polycrystalline materials.”\u00a0Acta Materialia. 55(17):5728-5732, 2007.","date":"10\/31\/2017","format":false,"excerpt":"RE Garc\u00eda, MD Vaudin \"Correlations between the crystallographic texture and grain boundary character in polycrystalline materials.\"\u00a0Acta Materialia. 55(17):5728-5732, 2007. Abstract A method is presented to determine the misorientation probability distribution function in polycrystalline materials based on a known, analytical or numerical, representation of the associated orientation probability distribution function, i.e.,\u2026","rel":"","context":"In "Papers"","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":338,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/the-effect-of-texture-and-microstructure-on-the-macroscopic-properties-of-polycrystalline-piezoelectrics-application-to-barium-titanate-and-pzn-pt\/","url_meta":{"origin":439,"position":5},"title":"RE Garc\u00eda, WC Carter, \u00a0SA Langer “The effect of texture and microstructure on the macroscopic properties of polycrystalline piezoelectrics: application to barium titanate and PZN\u2013PT”\u00a0Journal of the American Ceramic Society, 88(3):750-757, 2005.","date":"10\/31\/2017","format":false,"excerpt":"RE Garc\u00eda, WC Carter, \u00a0SA Langer \"The effect of texture and microstructure on the macroscopic properties of polycrystalline piezoelectrics: application to barium titanate and PZN\u2013PT\"\u00a0Journal of the American Ceramic Society, 88(3):750-757, 2005. Abstract The effects of crystallographic texture and microstructure are analyzed for polycrystalline tetragonal BaTiO3, pseudotetragonal PZN\u2013PT, and cubic\u2026","rel":"","context":"In "Papers"","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]}],"_links":{"self":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts\/439"}],"collection":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/comments?post=439"}],"version-history":[{"count":1,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts\/439\/revisions"}],"predecessor-version":[{"id":440,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts\/439\/revisions\/440"}],"wp:attachment":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/media?parent=439"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/categories?post=439"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/tags?post=439"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}