{"id":342,"date":"2017-10-31T17:17:51","date_gmt":"2017-10-31T17:17:51","guid":{"rendered":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/?p=342"},"modified":"2017-11-08T00:29:37","modified_gmt":"2017-11-08T00:29:37","slug":"challenges-and-results-for-quantitative-piezoelectric-hysteresis-measurements-by-piezo-force-microscopy","status":"publish","type":"post","link":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/challenges-and-results-for-quantitative-piezoelectric-hysteresis-measurements-by-piezo-force-microscopy\/","title":{"rendered":"BD Huey, R Nath, RE Garcia, JE Blendell &#8220;Challenges and results for quantitative piezoelectric hysteresis measurements by piezo force microscopy.&#8221; \u00a0Microscopy and Microanalysis. 11:6, 2005."},"content":{"rendered":"<p>BD Huey, R Nath, RE Garcia, JE Blendell &#8220;<a class=\"gsc_vcd_title_link\" href=\"https:\/\/www.cambridge.org\/core\/journals\/microscopy-and-microanalysis\/article\/challenges-and-results-for-quantitative-piezoelectric-hysteresis-measurements-by-piezo-force-microscopy\/3FFDA311CEB52031D25EEA3663185B2D\" target=\"_blank\" rel=\"noopener\" data-clk=\"hl=en&amp;sa=T&amp;ei=isH4WcWrOcq5mAHPuaXICQ\">Challenges and results for quantitative piezoelectric hysteresis measurements by piezo force microscopy<\/a>.&#8221; \u00a0<strong>Microscopy and Microanalysis<\/strong>. 11:6, 2005.<\/p>\n<h3>Abstract<\/h3>\n<div class=\"row\">\n<div class=\"large-10 medium-10 small-12 columns\">\n<div class=\"description\">\n<div class=\"abstract\" data-abstract-type=\"normal\">\n<p>Atomic Force Microscopy (AFM) has become a ubiquitous tool for analyzing the topography of a wide variety of materials, especially as nanoscale features become more significant for both understanding as well as determining materials properties [1]. Many AFM variations have also been developed for measuring surface properties beyond straightforward cartography. In many of these cases, the contrast mechanisms are often either extremely complex, or not well understood, even though the principles are simple. For example, Piezo-Force Microscopy (PFM) is relatively easy to understand and use in a standard lab for measuring electromechanical properties of materials, but care must be taken in order to obtain quantitative results as described below.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p class=\"post-excerpt\" class=\"post-excerpt\">BD Huey, R Nath, RE Garcia, JE Blendell &#8220;Challenges and results for&hellip;<\/p>\n<div class=\"link-more\"><a href=\"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/challenges-and-results-for-quantitative-piezoelectric-hysteresis-measurements-by-piezo-force-microscopy\/\">Continue reading<span class=\"screen-reader-text\"> &#8220;BD Huey, R Nath, RE Garcia, JE Blendell &#8220;Challenges and results for quantitative piezoelectric hysteresis measurements by piezo force microscopy.&#8221; \u00a0Microscopy and Microanalysis. 11:6, 2005.&#8221;<\/span>&hellip;<\/a><\/div>\n<div class=\"link-more\"><a href=\"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/challenges-and-results-for-quantitative-piezoelectric-hysteresis-measurements-by-piezo-force-microscopy\/\">Continue reading<span class=\"screen-reader-text\"> \"BD Huey, R Nath, RE Garcia, JE Blendell &#8220;Challenges and results for quantitative piezoelectric hysteresis measurements by piezo force microscopy.&#8221; \u00a0Microscopy and Microanalysis. 11:6, 2005.\"<\/span>&hellip;<\/a><\/div>","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"advanced_seo_description":"","jetpack_publicize_message":"","jetpack_is_tweetstorm":false,"jetpack_publicize_feature_enabled":true},"categories":[45],"tags":[11,10,14,48,16],"jetpack_publicize_connections":[],"jetpack_featured_media_url":"","jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/peeeSR-5w","jetpack_likes_enabled":true,"jetpack-related-posts":[{"id":348,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/the-influence-of-grain-boundaries-and-texture-on-ferroelectric-domain-hysteresis\/","url_meta":{"origin":342,"position":0},"title":"R Nath, RE Garc\u00eda, JE Blendell, BD Huey &#8220;The influence of grain boundaries and texture on ferroelectric domain hysteresis.&#8221;\u00a0JOM Journal of the Minerals, Metals and Materials Society, 59(1):17-21, 2007.","date":"10\/31\/2017","format":false,"excerpt":"R Nath, RE Garc\u00eda, JE Blendell, BD Huey \"The influence of grain boundaries and texture on ferroelectric domain hysteresis.\"\u00a0JOM Journal of the Minerals, Metals and Materials Society, 59(1):17-21, 2007. Abstract As ferroelectric device dimensions continue to shrink, the increasing ratio of boundary to bulk necessitates a thorough understanding of interfacial\u2026","rel":"","context":"In &quot;Papers&quot;","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":346,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/virtual-piezoforce-microscopy-of-polycrystalline-ferroelectric-films\/","url_meta":{"origin":342,"position":1},"title":"RE Garc\u00eda, BD Huey, JE Blendell &#8220;Virtual piezoforce microscopy of polycrystalline ferroelectric films.&#8221;\u00a0Journal of applied physics, 100:064105, 2006.","date":"10\/31\/2017","format":false,"excerpt":"RE Garc\u00eda, BD Huey, JE Blendell \"Virtual piezoforce microscopy of polycrystalline ferroelectric films.\"\u00a0Journal of applied physics, 100:064105, 2006. Abstract An innovative methodology is presented that utilizes the experimental results of electron backscattered diffraction to map the crystallographic orientation of each grain, the finite element method to simulate the local grain-grain\u2026","rel":"","context":"In &quot;Papers&quot;","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":354,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/response-surface-measurement-for-bifeo3-cofe2o4-multiferroic-nanocomposite\/","url_meta":{"origin":342,"position":2},"title":"BE Piccione, JE Blendell, RE Garc\u00eda &#8220;Response surface measurement for BiFeO3-CoFe2O4 multiferroic nano composite.&#8221;\u00a017th IEEE International Symposium on the Applications of Ferroelectrics. 2:1-3, IEEE, 2008.","date":"10\/31\/2017","format":false,"excerpt":"BE Piccione, JE Blendell, RE Garc\u00eda \"Response surface measurement for BiFeO3-CoFe2O4 multiferroic nano composite.\"\u00a017th IEEE International Symposium on the Applications of Ferroelectrics. 2:1-3, IEEE, 2008. Abstract A thin film BiFeO3 - CoFe2O4 multiferroic nanocomposite has been investigated to determine the coupling between the two phases in a constrained film by\u2026","rel":"","context":"In &quot;Papers&quot;","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":466,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/11\/04\/d-w-chung-n-balke-s-v-kalinin-re-garcia-virtual-electrochemical-strain-microscopy-of-polycrystalline-licoo2-films-journal-of-the-electrochemical-society-15810a1083-a1089-2011\/","url_meta":{"origin":342,"position":3},"title":"D-W Chung, N Balke, S V Kalinin, RE Garc\u00eda &#8220;Virtual Electrochemical Strain Microscopy of Polycrystalline LiCoO2 Films.&#8221;\u00a0Journal of The Electrochemical Society. 158(10):A1083-A1089, 2011.","date":"11\/04\/2017","format":false,"excerpt":"D-W Chung, N Balke, S V Kalinin, RE Garc\u00eda \"Virtual Electrochemical Strain Microscopy of Polycrystalline LiCoO2 Films.\"\u00a0Journal of The Electrochemical Society. 158(10):A1083-A1089, 2011. Abstract A recently developed technique, electrochemical strain microscopy (ESM), utilizes the strong coupling between ionic current and anisotropic volumetric chemical expansion of lithium-ion electrode materials to dynamically\u2026","rel":"","context":"In &quot;Papers&quot;","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":500,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/11\/04\/y-jing-s-leach-re-garcia-je-blendell-correlated-inter-grain-switching-in-polycrystalline-ferroelectric-thin-films-journal-of-applied-physics-11612124102-2014\/","url_meta":{"origin":342,"position":4},"title":"Y Jing, S Leach, RE Garc\u00eda, JE Blendell &#8220;Correlated inter-grain switching in polycrystalline ferroelectric thin films.&#8221;\u00a0Journal of Applied Physics, 116(12):124102, 2014.","date":"11\/04\/2017","format":false,"excerpt":"Y Jing, S Leach, RE Garc\u00eda, JE Blendell \"Correlated inter-grain switching in polycrystalline ferroelectric thin films.\"\u00a0Journal of Applied Physics, 116(12):124102, 2014. Abstract Ferroelectric domain switching within individual nanoscale grains of a 100\u2009nm thick polycrystalline PbZr0.2Ti0.8O3 thin film has been shown to depend on the relative crystallographic orientation of the adjacent\u2026","rel":"","context":"In &quot;Papers&quot;","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":361,"url":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/2017\/10\/31\/domain-switching-mechanisms-in-polycrystalline-ferroelectrics-with-asymmetric-hysteretic-behavior\/","url_meta":{"origin":342,"position":5},"title":"EM Anton, RE Garc\u00eda, TS Key, JE Blendell, KJ Bowman &#8220;Domain switching mechanisms in polycrystalline ferroelectrics with asymmetric hysteric behavior.&#8221;\u00a0Journal of Applied Physics. 105(2):024107-024107-8, 2009.","date":"10\/31\/2017","format":false,"excerpt":"EM Anton, RE Garc\u00eda, TS Key, JE Blendell, KJ Bowman \"Domain switching mechanisms in polycrystalline ferroelectrics with asymmetric hysteric behavior.\"\u00a0Journal of Applied Physics. 105(2):024107-024107-8, 2009. Abstract numerical method is presented to predict the effect of microstructure on the local polarization switching of bulk ferroelectric ceramics. The model shows that a\u2026","rel":"","context":"In &quot;Papers&quot;","img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]}],"_links":{"self":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts\/342"}],"collection":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/comments?post=342"}],"version-history":[{"count":2,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts\/342\/revisions"}],"predecessor-version":[{"id":574,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/posts\/342\/revisions\/574"}],"wp:attachment":[{"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/media?parent=342"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/categories?post=342"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/engineering.purdue.edu\/ComputationalMaterials\/index.php\/wp-json\/wp\/v2\/tags?post=342"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}